NANOHUNTER II: variable angle GI-XRF capability

effluent
effluent

For thin film analyses, a methodology called grazing incidence X-ray fluorescence (GI-XRF) may be employed whereby elements on and beneath the surface are selectively excited by varying the grazing angle of the X-ray source. In this example, a 25 nm nickel (Ni) thin film on a glass substrate was measured at two different grazing angles: 0.02° and 0.40°. Only Ni was strongly excited at 0.02 ° GI excitation condition (blue spectrum). However, elements included in the glass substrate are exited at the higher 0.40° angle (red spectrum) because X-rays penetrate more deeply into the substrate.