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FAST SDD® EDXRF spectrometer with QuantEZ software
High-resolution elemental analysis of Na through U
As a premium high performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.
XRF elemental analysis in the field, plant or lab
Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE is the reliable high performance choice for routine elemental analysis by XRF.
XRF with 60kV X-ray tube and SDD detector
The 60kV X-ray tube and Peltier cooled FAST SDD® Silicon Drift Detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).
XRF options: autosampler, vacuum, helium and standardless FP
Options include fundamental parameters, a variety of automatic sample changers, sample spinner and helium purge or vacuum atmosphere for enhanced light element sensitivity.
*FAST SDD® is a registered trademark of Amptek, Inc.
- Analyze ₁₁Na to ₉₂U non-destructively
- Powerful QuantEZ Windows®-based software
- Solids, liquids, alloys, powders and thin films
- 60kV X-ray tube for wide elemental coverage
- FAST SDD® detector for superior counting statistics
- Multiple automated tube filters for enhanced sensitivity
- Unmatched performance-to-price ratio
- Optional RPF-SQX fundamental parameters software
- Optional standardless fundamental parameters software
NEX DE specifications
Software & Application Packages
Powerful Windows® based QuantEZ software
QuantEZ analytical software was specifically designed for the Rigaku NEX series of benchtop EDXRF analyzers. Running under the Microsoft® Windows® operating system, on either a laptop or benchtop personal computer (PC), the software offers all the functions required calibration and routine operation. Rigaku has developed software that is not only user-friendly, but sophisticated and powerful enough for the most complex analysis. Based on the famous Rigaku easy-to-use flow bar interface, QuantEZ software walks the user through steps required to setup either an empirical or fundamental parameters application.
EZ Analysis interface, available in a variety of languages, is used for routine measurements. A live spectral display is shown in the right window.
NEX DE is optionally powered by new qualitative and quantitative fundamental parameters (FP) analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards – and rigorous quantitative analysis with standards. Featuring Rigaku’s famous Scatter FP method, the software can automatically estimate the concentration of unobserved low atomic number elements (H to F) and provide appropriate corrections.
RPF-SQX greatly reduces the number of required standards, for a given level of calibration fit, as compared to conventional EDXRF analytical software. As standards are expensive, and can be difficult to obtain for many applications, the utility of RPF-SQX can significantly lower the cost of ownership and reduce workload requirements for routine operation.