Low-cost energy dispersive X-ray fluorescence analyzer

Elemental analysis of solids, liquids, powders, alloys and thin films by EDXRF

NEX QC

As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control applications. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.

EDXRF optimized for quality control applications

Specifically designed for routine quality control elemental analysis applications, the new Rigaku NEX QC features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.

EDXRF with broad elemental coverage

The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

NEX QC options: autosampler, helium and FP

Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity. For those applications requiring higher resolution and sensitivity, Rigaku offers the new NEX QC+ energy dispersive X-ray fluorescence analyser which is equipped with a silicon drift detector (SDD).

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Features

  • Analyze ₁₁Na to ₉₂U non-destructively
  • Solids, liquids, alloys, powders and thin films
  • 50kV X-ray tube for wide elemental coverage
  • Semiconductor detector for superior data quality
  • Modern smartphone style "icon driven" user interface
  • Multiple automated tube filters for enhanced sensitivity
  • Convenient built in thermal printer
  • Low cost with unmatched performance-to-price ratio
  • Optional fundamental parameters

NEX QC specifications

Excitation
  • 50kV X-ray tube
  • 4W max power
  • 6 tube filter positions with shutter

Detection

  • High performance semiconductor detector
  • Peltier thermo-electric cooling
  • Optimum balance of spectral resolution and max count rate

Sample Chamber

  • Large 190 x 165 x 60 mm sample chamber
  • Single position 32 mm sample aperture
  • Single position 40 mm sample aperture
  • Bulk sample aperture
    6-position 32 mm automatic sample changer
  • 5-position 40 mm automatic sample chamber
  • Single position 32 mm sample spinner
  • Analysis in air or helium

Environmental Conditions

  • Ambient temperature 10-35ºC (50-95ºF)
  • Relative humidity ≤85% non-condensing
  • Vibration: undetectable by people
  • Free from corrosive gas, dust and particles

Software & Application Packages

  • Qualitative and quantitative analysis
  • Normalization and validation feature
  • Fundamental parameters
  • Data export function with LIMS compatibility
  • User selectable shaping times
  • Simple flow bar wizard to create new applications
  • Icon driven graphical user interface

User Interface

  • Embedded computer
  • Internal thermal printer
  • USB & Ethernet connections

Spectrometer Data

  • Single phase AC 100/220V, 1.4A (50/60 Hz)
  • Dimensions: 33.1(W) X 43.2(D) X 37.6(H) cm (13 X 17 X 14.8 inch)
  • Weight: 16 kg (35 lbs)

Options

  • 6-position 32 mm automatic sample changer
  • 5-position 40 mm automatic sample chamber
  • Single position 32 mm sample spinner
  • Helium purge
  • Fundamental parameters
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NEX QC accessories

Several third party vendors supply industry standard sample preparation equipment and sample holders/films that may be used with this equipment.

  • 6-position 32 mm automatic sample changer
  • 5-position 40 mm automatic sample chamber
  • Single position 32 mm sample spinner
  • Helium purge
  • Fundamental parameters
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