HyPix-3000 is a next-generation two-dimensional hybrid pixel array semiconductor detector designed specifically to meet the needs of the home lab diffractionist.
Chemical crystallography
Composition Identification
Crystal orientation
Drug discovery
Elemental analysis
In vivo applications
Non-destructive testing
Particle size & shape
Phasing protein structures
Polymers & fibers
Polymorphs
Pore size distribution
Qualitative analysis
Semiconductor metrology
Spectroscopy
Structure based drug design
Sulfur in petroleum
Texture & pole figures
Thin film analysis
Cement
Chemistry
Coatings
Cosmetics
Education
Environmental
Food & food ingredients
Forensics & conservation
Geology & minerals
Materials science
Metals & alloys
Mining & refining
Nanotechnology
Petroleum & petrochemicals
Pharmaceuticals 
Photovoltaic manufacturing
Polymers, plastics & rubber
Process control
Semiconductor manufacturing
Synchrotrons & beamlines
Combined XRD-DSC
High resolution XRD
High temperature XRD
In-plane XRD
Laser-induced breakdown spectro.
Low temperature XRD
Microdiffraction
Microtomography
Powder crystallography
Protein crystallography
Raman spectroscopy
Rietveld analysis
Residual stress XRD
SAXS: biological
SAXS: industrial 
Single crystal XRD
X-ray fluorescence (XRF)
X-ray reflectometry (XRR)
Crystallography Times 
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Open positions (Jobs)EDXRF: Energy dispersive X-ray fluorescence analyzer
Elemental analysis of solids, liquids, powders, alloys and thin films by EDXRF
NEX QC+
For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.
EDXRF for quality control applications
Specifically designed for routine quality control applications, the new Rigaku NEX QC+ features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.
EDXRF with high precision and broad elemental coverage
The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).
EDXRF with autosampler, helium and FP options
Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.
Features
- Analyze ₁₁Na to ₉₂U non-destructively
- Solids, liquids, alloys, powders and thin films
- 50kV X-ray tube for wide elemental coverage
- SDD detector for superior resolution and sensitivity
- Modern smartphone style "icon driven" user interface
- Multiple automated tube filters for enhanced sensitivity
- Convenient built in thermal printer
- Low cost with unmatched performance-to-price ratio
NEX QC+ specifications
Excitation
Detection
Sample Chamber
Environmental Conditions
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Software & Application Packages
User Interface
Spectrometer Data
Options
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NEX QC+ applications
NEX QC+ accessories
Several third party vendors supply industry standard sample preparation equipment and sample holders/films that may be used with this equipment.
- 6-position 32 mm automatic sample changer
- 5-position 40 mm automatic sample chamber
- Single position 32 mm sample spinner
- Helium purge
- Fundamental parameters
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Product in the spotlight
The benefits of WDXRF, light element sensitivity and high spectral resolution, in a benchtop instrument. The Supermini200 is about ½ the price and ¼ the size of conventional WDXRF systems.
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