Micro-spot analysis of an inclusion pigment on paper

When an irregularity appears in a production setting, an immediate need for identification and rectification on the problem arises. Failure analysis and quality control testing are analytical staples to any reliable production facility, and the analytical tools that can accomplish these investigative needs are invaluable.

The Rigaku ZSX Primus II WDXRF spectrometer can reliably and accurately pinpoint elemental differences in a variety of materials through small scale micro-spot analysis via the wavelength dispersive X-ray fluorescence technique. The ZSX Primus II micro-spot analysis collimates the analyzed area to 0.5 mm or 500 microns in diameter, and ensures precision placement with the combined integration of an R-θ stage and a high resolution CCD camera inside the instrument.

In the following example, an inclusion or discoloration in a coated paper type sample is analyzed. Two micro-spot analyses were done for a qualitative comparison of the pigmented area and a blank spot for reference. The areas of analysis that were selected are indicated by the black Xs in Figure 1.

Pigmented paper sample on the ZSX Primus II CC
Figure 1: Pigmented paper sample on the ZSX Primus II CCD

Clearly, an elemental difference exists in the paper materials, which is primarily calcium-based, and the discolored pigment, which seems to be silicon-based, as seen in Figure 2.

elemental difference exists in the paper materials
Figure 2



ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time. Read more about ZSX Primus II...

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