Rigaku Journal (ISSN 2187-9974)

Volume 12 No. 2/November 1995

  • Preface: 100 Years of X-rays by Ulrich Hennig
  • Preface: To W.C. Röntgen 100 years later by Jenny P. Glusker
  • Microdiffraction Used to Study Domain Switching of Ferroelectric Thin Films by Michael O. Eatough, Mark A. Rodriquez, Duane Dimos and Bruce Tuttle
  • Crystal Structure of Zeolite Y as a Function of Ion Exchange by J. A. Kaduk and J. Faber
  • Utilization of the R-AXIS Area Detector in Routine Small Molecule X-ray Structure Determinations by P. J. Carroll
  • High Power X-ray Generator for XAFS Experiments by K. Sakurai and H. Sakurai
  • High-Speed X-ray Diffractometer R-AXIS IV
  • Rigaku/MiniFlex+ X-ray Diffractometer System
  • Total Reflection X-ray Spectrometer SYS 3700LE—Designed for Light Element Analysis
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Volume 12 No. 1/November 1995

  • Preface by P. K. Predecki
  • Zeolite Structure Analysis with Powder X-ray Diffraction and Solid-State NMR Techniques by G. T. Kokotailo and C. A. Fyfe
  • On the Use of Energy Dispersive X-ray Reflection to Study the Electronic Density Profile at Surfaces and Interfaces by R. Felici
  • If Your Only Single Crystal is Not Really Single by L. W. Finger
  • The 6 m Point-Focusing Small-Angle X-ray Scattering Camera at the High-Intensity X-ray Laboratory in Kyoto University and the Application to Polymer Science by S. Suehiro, H. Miyaji, Y. Miyamoto and T. Yoshizaki
  • Measurement of Thin Films on Single Crystal Substrates by the 2θ/α Scanning Methods by M. Nakayama
  • Grazing Incidence X-ray Reflectometer GXR²
  • On-Line Multichannel Simultaneous X-ray Spectrometer System Simultix 10S, Simultix 11S
  • Time Saver Mercury Analysis System RA-Mercury Analyzer with Sample-Changer
  • The 100 Year Discovery of X-rays and W. C. Röntgen's 150 Birthday
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Vol. 11 No. 2/November 1994

  • Preface by J. V Gilfrich
  • Small Molecule Diffraction Studies with the R-AXIS Area Detector -Structural Aspects of a Class of Urea Inclusion Compounds by M. E. Brown, M. D. Hollingsworth and B. D. Santarsiero
  • Residual Stress in Ion Implanted Titanium Nitride Studied by Parallel Beam Glancing Incidence X-ray Diffraction by D. E. Geist, A. J. Perry, J. R. Treglio, V. Valvoda and D. Rafaja
  • A Suggestion for Use of Ultrashort Wavelength X-rays -A Report on Development and Testing of a High-Resolution Analytical System for Electron Density Distribution by F. P. Okamura
  • Imaging of Diffraction Data by the Maximum Entropy Method -A New Approach To Crystallography by M. Sakata
  • An Introduction to X-ray Absorption Fine Structure by Y. Udagawa
  • X-ray Microdiffractometer PSPC/MDG 2000
  • High Sensitivity Total Reflection X-ray Spectrometer System 3700
  • The Apparatus Used for Measuring Mercury in the Fluorescent Lamp of the Liquid Crystal Display Mercury/TM-2
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Vol. 11 No. 1/May 1994

  • Preface by A. Clearfield
  • A Practical Approach to Data Collection Using the R-AXIS II by J. Tanner and K. L. Krause
  • Automated Stress Mapping Using a Microbeam Diffractometer by P. W. DeHaven
  • Advances in PC Software for XRD by Q. Johnson
  • Mesomorphic Investigation of Some Tolane-Based Side-Chain Liquid Crystalline Polymers by Ging-Ho Hsiue, Chang-Jyh Hsieh and Ru-Jong Jeng
  • Development of Total Reflection X-Ray Diffractometer for Structural Analysis of Ultra-thin Films by Laue Method by T. Horiuchi and K. Matsushige
  • Quantitative Analysis of Rock Samples by an X-ray Fluorescence Spectrometer (1)
  • Imaging Plate Diffractometer for Small Molecule Applications R-AXIS CS
  • Multichannel Simultaneous X-ray Spectrometer Systems "Simultix 10", "Simultix 11"
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Vol. 10 No. 2/November 1993

  • Preface by S. Tanaka
  • X-ray Polycrystalline Diffraction Analysis of Thin Films by T. C. Huang
  • Applications of X-ray Fluorescence-Pattern Recognition in Forensic Archaeometry and Archaeomaterials Analyses by N. W. Bower, J. O. Speare, and W. J. Thomas
  • Dynamic Deformation Densites and Their Chemical Interpretation by T. S. Cameron, P. K. Bakshi, B. Borecka, and W. Kwiatkowski
  • X-ray Residual Stress Measurement in Micro Areas of Ceramics by N. Fujii and S. Kozaki
  • Wide Angle Goniometer "ULTIMA" System
  • EXAFS 3000 - A Spectrometer for Extended X-ray Absorption Fine Structure (with a horizontally held sample)
  • >R-AXIS II -Options and Accessories
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Vol. 10 No. 1 /May 1993

  • Preface by H. M. Kanare
  • Quantitative X-ray Diffraction from Thin Films by I. K. Schuller and Y. Bruynseraede
  • Combining Molecular Mechanics and X-ray Diffraction Methods by C. L. Day and R. A. Jacobson
  • The Monomeric Form of Photosystem I Reaction Center of the Thermophilic Cyanobacterium Mastigocladus laminosus: Recent Progress in Crystallization of the Complex by T. Gilon, B. Shaanan and R. Nechushtai
  • A High-Speed Data-Collection System (R-AXIS IIC) for Large-Unit-Cell Crystals Using an Imaging Plate as a Detector and a Rotating-Anode as X-ray Source by M. Sato
  • Research Concerning Elimination of Mercury in Flue Gases Using a Filter Layer by M. Takaoka
  • New Automatic X-ray Diffractometer System D/MAX-2000 Series
  • Theta/Theta Goniometer System with a Rotating Anode X-ray Source (TTR)
  • Time-Sharing X-ray Imaging System R-AXIS DS
  • Fully Automated X-ray Spectrometer RIX2000
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Vol. 9 No. 2/November 1992

  • Preface by R. Jenkins
  • Diffuse Scattering from Crystals of Yeast Initiator TRNA by A. R. Kolatkar, J. B. Clarage, and G. N. Phillips. Jr.
  • Ceramic Wear Track Characterization by Advanced X-ray diffraction by M. Woydt, A. Skopp and H. Hantsche
  • Accurate Measurement of Unit-Cell Parameters by the Powder Diffraction Method: The Use of Symmetric Experimental Profile and a New Algorithm for Systematic Error Correction by H. Toraya
  • Structural Analysis of Semiconductor Superlattices by Y. Kitano, K. Okada, and Y. Mori
  • R-AXIS IID: a Two-Dimensional Detector System Using Imaging Plate by K. Sasaki
  • Automated X-ray Single Crystal Diffractometer AFC-7 Series
  • teXsan Structure Analysis Software
  • X-ray Spectrometer RIX1000
  • Rapid Measurement System for Single Crystal Orientation RASCO-L
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Vol. 9 No. 1 /May 1992

  • Preface by Krishan Lal
  • Syntheses, Properties, and X-ray Crystal Structures of "Fantastic" Molecules with High Distortions by C. Kabuto, K. Ebata, A. Sekiguchi and H. Sakurai
  • Production Control of Portland Cement Manufacturing Process by X-ray Fluorescence by B. D. Wheeler
  • Determination of Multielement in Manganese Nodules on Board Using X-ray Fluorescence Spectrometry by W. Yimin, L. Guoli and T. Yunye
  • Instrumentation and Applications of Total Reflection Fluorescent X-ray Spectrometry by Rigaku Industrial Corporation
  • Multi-purpose X-ray Diffractometer
  • Crystal Collimator-equipped High-resolution X-ray Diffractometer SLX-1 HRD
  • X-ray Flat Plane Orientation Measuring Unit for Silicon Ingots
  • Fully Automated X-ray Spectrometer System RIX 3000
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Vol. 8 No. 2/November 1991

  • Preface: The Progress in Crystal Structure Determination over the Last Forty Years: a Memoir by a Man who Tried to Eliminate His Specialty by Yoshi Okaya
  • Relationship between Cutting Performance and Residual Stress of PVD Coated Film on Cemented Carbide Tool by I. Yazaki, M. Kohata, and K. Sasaki
  • An Advanced Technique of X-ray Diffractometry for in Situ Observation at High Temperatures — Application for Intermetallic Compounds by M. Kimura
  • Advanced X-ray Diffractometer and Application to Petrochemical Products - Measurement of Polymer Compounds by X-ray Diffractometry by G. Fujinawa
  • USASG-1 Ultra-small-angle X-ray Scattering Study: Preliminary Experiments of Colloidal Suspensions
  • 10" Topography Imaging System
  • Fully Automatic Double Crystal X-ray Diffractometer "ADOX"
  • Mercury Monitor EMP-1 for Working Environment
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Vol. 8 No.1/May 1991

  • Preface by C.N.R. Rao
  • Microbeam X-ray Diffraction and Its Applications in the Semiconductor Industry: A 15 Year Retrospective by P. W. DeHaven, C. C. Goldsmith, and T. L. Nunes
  • Applications of HAUP Method to Studies of Phase Transitions by J. Kobayashi
  • Ultra-Small-Angle X-ray Scattering by H. Matsuoka, K. Kakigami and N. Ise
  • Thin Film X-ray Diffractometry by H. Araki
  • High Temperature X-ray Diffractometer Attachment Series
  • High Precision Fully Automated Piezo Goniometer
  • High Sensitivity Type Total Reflection X-ray Spectrometer System 3726 -Wafer Surface Analysis System
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