Rigaku Journal (ISSN 2187-9974)

Volume 7 No. 1/May 1990

  • Preface by Gerald R. Lachance
  • Minimizing the Sources of Error in the Analysis of Geological Samples by X-ray Fluorescence by N. W. Bower, P. E. Neifert, C. M. Lewis, and G. Luedemann
  • Fluid, Hexatic, and Crystal Phases in Terephthal-bis-(4n)-Alkylanilines by D. Y. Noh, J. D. Brock, J. D. Litster, R. J. Birgeneau, and J. W. Goodby
  • Thermophysical Properties of Boron Phosphide Single Crystalline Wafers by Y. Kumashiro
  • Single Crystal Orientation Measurement by X-ray Methods by T. Kikuchi
  • Scanning Type Double Crystal Topographic Goniometer Model 2
  • On-Line Measurement & Analysis System
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Volume 6 No. 2/November 1989

  • Preface by Fan Hai-fu
  • The Powder Diffraction File: Past, Present and Future by D. K. Smith and R. Jenkins
  • Non-Destructive Determination of Load and Residual Stresses by the X-Ray Stress Method by I. O. Benning
  • Determination of a Difficult Structure: A Case of Strong Correlations between Parameters by R. Kuroda
  • Whole-Powder-Pattern Decomposition Method by H. Toraya
  • Micro Area X-ray Diffraction Techniques by H. Araki
  • The D/max-1000 Series Offers a New World in X-ray Diffraction
  • The World of the Integrated Rietveld Analysis System FAT-RIETAN: A Message to Users of the Rigaku Version
  • A New Version R-SAPI-88
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Volume 6 No. 1/May 1989

  • Preface by Raymond Jeanloz
  • Analysis of Rocks Using X-ray Fluorescence Spectrometry by Timothy E. La Tour
  • RIETAN A Software Package for the RIETVELD Analysis and Simulation of X-ray and Neutron Diffraction Patterns by F. Izumi
  • An Introduction to In-house EXAFS Facilities by Y. Udagawa
  • Residual stress Distribution in the Surface near the Joining Boundary of β-Si₃N₄ and Carbon Steel by S. Tanaka and K. Oguiso
  • Standardless X-ray Fluorescence Spectrometry (Fundamental Parameter Method Using Sensitivity Library) by Y. Kataoka
  • X-Y Stage with a Mapping Function, and Curved PSPC Micro-area X-ray Diffractometer with a Total Reflection Capillary Collimator
  • TEXSAN™ Structure Solution Package
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Volume 5 No. 2/November 1988

  • Preface by K. L. Chopra
  • Non-isothermal in situ XRD Analysis of Dolomite Decomposition by P. Engler, M. W. Santana, M. L. Mittleman and D. Balazs
  • A Revaluation of Film Methods in X-ray Scattering by C. G. Vonk
  • Structure of Short- and Medium-range Order of Fe-rich Amorphous Fe-La Alloys by M. Matsuura, H. Wakabayashi, T. Goto, H. Komatsu and K. Fukamichi
  • Fully Automated Piezogoniometer (Automatic Quartz Blank Classifier) by Y. Kobayashi, M. Usui and Y. Hirai
  • Application of X-ray Diffraction Techniques to the Semiconductor Field by S. Munekawa
  • PSPC Micro Area X-ray Stress Analyzer
  • X-ray Excitation Nondispersive Type X-ray Spectrometer-Mini X Series
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Volume 5 No. 1/May 1988

  • Preface: Some Observations on Recent Developments in Polycrystalline Diffraction by W. Parrish
  • Analysis of Semiconductors by Double-crystal X-ray Diffractometry by M. A. Capano, K. L. Kavanagh, S. Bensoussan and L. W. Hobbs
  • Direct Observation of Electric Field Induced Changes in Real Structure of Semiconductors and Insulators by Krishan Lal
  • Step Counting with the Rigaku Miniflex by D. M. Nicholas, R. V. Meddes and L. C. Hodges
  • TRIAX Goniometer for Monocrystal X-ray Diffractometry
  • X-ray Diffractometer System for Macromolecules R-AXIS II
  • Full Automatic Computer Controlled Atomic Absorption Spectrophotometer A-SPEC 205
  • Multi-Function High Resolution Wide Angle Goniometer PMG-VH
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Volume 4 No. 1 & 2/December 1987

  • Preface by H. Fueß
  • Macromolecular X-ray Data Collection on A Rotating Anode Diffractometer by H. Hope, F. Frolow and J. L. Sussman
  • Characterization of Thin Films by Glancing Incidence X-ray Diffraction by R. D. Tarey, R. S. Rastogi and K. L. Chopra
  • Transient Hot Strip Techniques for Measuring Thermal Conductivity and Thermal Diffusivity by S. E. Gustafsson
  • Two Simple Fiber Diffraction Experiments for Students to Obtain Basic Structural Parameters of Proteins and Nucleic Acids by Y. Mitsui, K. T. Nakamura, Y. Iitaka, H. Nagase and R. Yamaguchi
  • Topics by H. Wondratschek
  • SSD-Mounted Fully Automated Right-Left Pole Figure Diffractometer
  • Laser Flash Method Thermal Constant Measuring Unit
  • Full Automatic X-ray Photoelectron Spectroscopy XPS-7000
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Volume 3 No. 2/November 1986

  • Preface by W. Hoffman
  • The Spot Technique for Small Sample Amounts in Sequential XRF Analysis by C. Freiburg and W. Reichert
  • Study of the Mechanical Behaviour of Materials by Using Synchrotron Radiation by G. Maeder, M. Barrel, J. L. Lebrun and M. Sprauel
  • Molecular Model Building and Inspecting Using Newman Projections and Bit Mapped Graphics by H. Schenk and R. A. J. Driessen
  • Rapid Quantitative Measurement System for Retained Austenite (Multi-PSPC System)
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Volume 3 No. 1/April 1986

  • Preface by F. Liebau
  • Reflections on a Decade of Synchrotron X-radiation Protein Crystallography by R. Helliwell
  • Some Applications of Rotating Anode X-ray Generators in the Fields of Wide Angle Scattering, Compton Spectroscopy, and Extended X-ray Absorption Fine Structure by S. Steeb and P. Lamparter
  • R-SAPI-85: A Computer Program for Automatic Solution of Crystal Structures from X-ray Diffraction Data by Fan Hai-fu
  • Rotating Anode High-power X-ray Generator RU-500~1500
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Volume 2 No. 2/November 1985

  • Preface by O. Kratky
  • In-lab. X-ray Absorption Experiments on mixed Valent Materials by M. F. Ravet and G. Krill
  • Rigaku D/max-B and Micro-processor
  • Weissenberg Camera for Macromolecular Crystallography
  • Low Temperature Attachment (Cooling Gas Nozzle for Protein Measurement) for Automatic Four-circle X-ray Diffractometer AFC
  • Microfocus X-ray System MRS-160
  • Rapid X-ray Stress Analyzer PSPC/MSF System
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Vol. 2 No. 1/June 1985

  • Preface by M. M. Woolfson
  • X-ray Microdiffraction in Bio-medical Studies by J. M. Very
  • X-ray Investigations on the Surface Residual Stresses Produced by
    Hydrogen Diffusion in a Plain Low Carbon Steel by B. Pathiraj and R.
    Vasudevan
  • Rigaku Single Crystal X-ray Diffractometer for Structure Analysis

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