Espectrómetro de fluorescencia de rayos X de dispersión por longitud de onda

WDXRF de máximo rendimiento para un rápido análisis elemental cuantitativo

ZSX Primus

El Rigaku ZSX Primus entrega una determinación rápida y cuantitativa de los elementos atómicos mayores y menores, desde el berilio (Be) hasta el uranio (U), en una amplia variedad de tipos de muestras - con las normas mínimas.

Análisis elemental poderoso, flexible y confiable

El instrumento más reciente de la serie Rigaku ZSX, el Primus ZSX, continúa la tradición de entrega de resultados precisos de manera oportuna y perfecta, con una fiabilidad incomparable, flexibilidad y facilidad de uso para cumplir con los desafíos del laboratorio moderno.

Rendimiento de bajo Z con asignación y análisis de multipunto

ZSX Primus proporciona un rendimiento superior y tiene la flexibilidad de analizar las muestras más complejas; cuenta con un tubo de 30 micras, el tubo con final de la ventana más delgado disponible en la industria, para la detección de límites de elementos de luz excepcional (bajo Z). Combinado con el paquete de asignación más avanzado para detectar la homogeneidad y las inclusiones, el ZSX Primus permite una investigación mas fácil y detallada con muestras que ofrecen una visión de análisis que no se obtiene fácilmente con otras metodologías analíticas. También esta disponible el análisis de multipunto que ayuda a eliminar los errores de muestreo en los materiales no homogéneos.

Parámetros fundamentales SQX con software EZ-scan

El EZ-scan permite a los usuarios analizar las muestras desconocidas sin ningún tipo de configuración previa. Esta característica le ahorra tiempo y sólo requiere unos cuantos clics en el ratón y un nombre de muestra para ingresar. Combinado con los parámetros fundamentales del software SQX, este proporciona los resultados más rápidos y precisos de XRF. El SQX es capaz de corregir automáticamente todos los efectos de la matriz, incluyendo las líneas de solapamientos. El SQX también puede corregir el efecto de excitación secundaria por fotoelectrones (elementos ligeros y ultraligeros), variando las atmósferas, las impurezas y los diferentes tamaños de muestra. Para obtener la mayor precisión debe utilizar la biblioteca de coincidencia y programas de análisis de escaneo perfectos.

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Features

  • Análisis de elementos de Be a U
  • No ocupa mucho espacio en el laboratorio
  • Microanálisis para estudiar muestras tan pequeñas como de 500 µm
  • Su diseño de tubo por debajo está optimizado para líquidos y polvos sueltos
  • Tubo de 30μ ofrece un rendimiento superior de elementos ligeros
  • Función de asignación (mapeo) para la topografía elemental/de distribución
  • El sello de Helio demuestra que la cámara de muestreo está siempre en vacío

ZSX Primus specifications

General

Elemental coverage
₄Be through ₉₂U

Optics
Wavelength dispersive, sequential, tube below
X-ray generator

X-ray tube
End window, Rh-anode, 3kW or 4 kW, 60kV

HV power supply
High frequency inverter, ultra-high stability

Cooling
Internal water-to-water heat exchanger
Spectrometer

Sample changer
48 positions standard, 104 SSLS optional

Sample inlet
Air lock system

Maximum sample size
51 mm (diameter) by 30 mm (high)

Sample rotation speed
30 rpm

Primary X-ray filters
Al25, Al125, Ni40, Ni400 and Be (optional, for window protection)

Beam collimators
6 auto-selectable diameters: 35, 30, 20, 10, 1 and 0.5 mm
27 mm can be selected instead of 30 mm for SSLS

Divergence slit
3 auto-selectable: standard, high, and coarse (optional) resolutions

Receiving slit
For SC and for F-PC detectors

Goniometer
θ – 2θ independent drive mechanism

Angular range
SC: 5-118°, F-PC: 13-148°

Angular reproducibility
Ultra-high precision

Continuous scan
0.1 - 240°/min

Crystal changer
10 crystals, automatic mechanism

Vacuum system
2 pump high-speed system w/ (optional) powder trap

He flush system
Optional, with partition
Detector systems

Heavy element detector
Scintillation counter (SC)

Light element detector
Flow proportional counter (F-PC)

Attenuator
In-out automatic exchanger (1/10)

Smart Sample Loading System

Rigaku’s new Smart Sample Loading System (SSLS) adds a new dimension of flexibility to the ZSX Primus WDXRF spectrometer. For sample types that are amenable to such a process, a vacuum chuck can be used to load samples into pre-loaded sample holders. This sample loading system has two important consequences: time is saved by the operator since they are no longer required to manually load each sample in a sample cup and the number of samples that can be held on the sample deck is increased significantly

Permissible sample types

Rigaku’s SSLS can handle samples up to 50 grams in weight and the modular sample deck racks have been designed for different sample diameters. Samples with a diameter of 35 mm can be stored 32 samples to a rack with three such racks sitting on the deck. Samples with a diameter of 40 mm can be stored 24 samples to a rack with a possibility of three of these racks on the deck. In addition, the racks can be mixed so that different sample sizes are easily accommodated on the deck at the same time. Sample types that are amenable to this type of loading procedure include fused glass beads and pressed powders. Both plastic and metal pressed powder holders are permitted.

Sample handling

A precision vacuum chuck is used to safely and reproducibly pick up the samples and place them in the measurement sample holder. Each sample type has a specific sizing ring positioned in the measurement sample holders to assure that the sample is properly positioned for measurement, and the analytical reading surface is never compromised.

Sample tracking

Keeping track of samples has never been easier. A two-dimensional barcode can be attached to the non-analysis surface of each sample. Before the sample is lowered into the pre-evacuation chamber through the input port, the barcode is scanned and the sample information is loaded into the control software.

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Features

  • Increasesthe number of samples on deck
    • The maximum number of samples that can be loaded in the same installation space as compared to the conventional sample changer has been increased from 48 to 104 units (when ∅35mm sample trays are used)
  • Flexible combination of sample trays
    • It is possible to combine various sample trays (the sample trays for the standard sample holder, for ∅35mm sample size and ∅40mm sample size) in various combinations with a simple software operation for deck configuration.
  • Automated analysis interface provided
    • By communicating with the automated analytical system control computer, the sample set at the sample transfer position is measured automatically.
  • Significantly reduces labor requirements and improves accuracy
    • With integrated barcode reader (option), labor requirements are reduced and data transcription accuracy increased.
If you are unable to view this video, click here to download it (315 MB).

ZSX Primus overview

  • Qualitative analysis:
    • Automatic peak identification
    • Smoothing, background subtraction
  • Quantitative analysis:
    • Matrix correction: Lachance-Traill, DeJohngh, JIS, etc.
    • Linear, quadratic and cubic regression, multiple line
    • Fundamental parameter method
  • EZ scan (qualitative)
  • Application template
  • Analysis area automatic selection (mask size detection)
  • Peak deconvolution (function and standard profile)
  • Background fitting (multi-point function fitting, area designation)
  • Fixed precision analysis
  • Help function
  • E-mail forwarding function
  • Universal standard sample
  • Analysis simulation program (analysis depth evaluation, etc.)

Optional:

  • SQX program:
    • EZ scan (SQX)
    • Fixed angle measurement
    • Thin-film analysis
    • Theoretical overlap correction
    • Drift correction library
    • Photoelectron FP method
    • He atmosphere correction
    • Sample film correction:
      • Impurity correction
      • Matching library
      • SQX scatter FP method
      • Material judgment
  • Quantitative scatter FP method
  • Quantitative FP theoretical overlap correction
  • Fusion disk correction (flux evaporation)
  • Charge correction
  • Program operation:
    • Time preset analysis
    • Energy saving
    • Auto power off
  • Sample observation mechanism
  • Point/mapping function
  • Remote control function (VCP)
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