Forensics
X-ray analytical methods have a long history as important tools used to investigate and establish facts in criminal or civil courts of law. Law enforcement at local, state, national, and international levels, as well as customs offices, routinely use X-ray tools to identify, compare or analyze unknown materials. Small spot X-ray fluorescence (XRF) is a non-destructive method that can not only identify and quantify a vast number of atomic elements but also generate area maps of elemental distribution. Common applications include mapping of Pb and Cu residue from bullet holes in clothing, glass chip analysis, ink content and residue analysis. X-ray diffraction (XRD) can identify chemical phases in complete unknowns. For both techniques, quantitative results can be obtained without the use of standards. Rigaku technology and expertise provide a number of unique solutions for forensic applications:
XRF
- Low-cost: Primini
- Mapping: ZSX Primus, ZSX Primus II
- Analysis without standards: Primini, ZSX Primus, ZSX Primus II
XRD
- Low-cost analysis: MiniFlex™
- Microdiffraction: D/MAX RAPID
- High-power θ/θ goniometer system: TTRAX III
- High-performance XRD: Ultima IV