We are pleased to announce that Rigaku Europe SE will be holding a three-day Thin Film XRD Forum at our Center of Expertise in Neu-Isenburg (Frankfurt area, Germany).

Satellite tutorial sessions will start at 2 p.m. on Monday, February 10, 2020. The main event will start at 10 a.m. on Tuesday, February 11. The meeting will conclude on Thursday, February 13 at 5 p.m.

During the meeting we will discuss XRD topics as well as advanced X-ray scattering techniques including:

• XRD methods for defect structure evaluation.
• Analysis of 2D/1D/0D objects (bulk materials, surfaces and interfaces, nano-objects and point defects).
• X-ray topography.
• Advanced modelling of surfaces and interfaces using the XRR technique. GISAXS method for the comprehensive surface study.
• Texture evaluation on thick films and coatings (ODF, Inverse pole figure).
• Residual stress measurements (calculation of principal stress, calculation of full stress tensor) along with different measurement approaches (incl. 0D/1D/2D methods).
• Other relevant topics are considered and welcome for discussion

High quality scientific content will be provided by an international expert team. Among them are:

• Prof. Vaclav Holy (Charles University and CEITEC, Czech Republic)
• Dr. Vladimir Kaganer (Paul Drude Institute, Germany)
• Dr. Kiyoshi Ogata (Rigaku Corporation, Japan)
• Dr. Roland Weingärtner (IISB-Fraunhofer, Germany)
• Dr. Artem Shalimov (Rigaku Europe, Germany).
• … and others

Please, join us to discover the latest developments in Thin-Film X-ray diffraction from Rigaku and discuss your research with recognized XRD scientists, share your experience and provide your feedback to Rigaku team helping us developing better instruments and analytical techniques.

What: Rigaku XRD Forum.
When: from 10th/11th till 13th February 2020.
Where: Rigaku office in Neu-Isenburg,
Hugenottenallee 167, 63263 Neu-Isenburg, Frankfurt area, Germany.

The event is intended to allow an open discussion on classical XRD topics as well as on advanced X-ray scattering techniques. We look forward to interesting exchanges and high quality scientific conversations. Topics:

• High-Resolution XRD
• X-ray topography
• X-ray reflectometry
• SAXS and GISAXS
• Non-coplanar (in-plane) diffraction
• Evaluation of texture
• Evaluation of stress and strain in layers and bulk materials

Participants will have the opportunity to display their posters on exhibition boards.

We also provide a “Job market” stand for open position announcements.

Registration is free but required as places are limited.

Registration is now closed