Welcome

With this issue we are pleased to launch a new comic strip that is dedicated to the amazing discoveries that seem to occur daily in the field of nanotechnology. This month a nanotechnology researcher has a lab accident, which leads to the creation of Captain Nano. Join us each month as Captain Nano uses his newly obtained powers to tackle the world on a nano level.

This month’s book review (Marketing for Scientists: How to Shine in Tough Times) covers a very well written book that would be of use to most people reading this newsletter. After reading the review, I had to read the book myself and found it to be an extremely good explanation of modern marketing ideas as applied to an individual’s career. These are not concepts that are normally taught to scientists and engineers, but they probably should be, and if you take the time to read this book, I think you will be glad you did.

Enjoy the newsletter.

Featured Rigaku Journal Article X-ray thin-film measurement techniques IV: SAXS & GISAXS Aya Ogi and Katsuhiko Inaba, Application Laboratory, Rigaku Corporation Small angle X-ray scattering (SAXS) is a technique widely used for characterization of size and distribution of particles dispersed in liquid, or those of pores/textures in porous bulk samples. Grazing incidence small angle X-ray scattering (GISAXS) is a reflection SAXS technique employed for thin film characterization. It reveals size and distribution of nano-sized 2- or 3-dimensional objects on a flat substrate. In this article, application of SAXS, GISAXS and in-plane GISAXS are discussed. Read more >

Customer in the Spotlight Dr. Anthony R. Kampf, Curator Emeritus of the mineral science lab at NHM The Natural History Museum of Los Angles County is celebrating its 100th anniversary next month and it seemed like a good time to highlight the extraordinary work of Anthony Kampf, the scientist responsible for developing the current mineral science lab at NHM based around his knowledge of mineralogy, crystal chemistry and structural crystallography. Read more >

Featured Application Note Advanced SQX Analysis by Scatter FP Method on the Supermini200 In 2005, Rigaku developed a new method to estimate an average atomic number for non-measured elements from hydrogen to oxygen in a specimen using the intensities of scattered X-rays and applied the estimation to the semi-quantitative FP calculation (SQX) as a balance component. This powerful technique is available for use with Rigaku’s cost effective benchtop WDXRF spectrometer, the Supermini200. Read more >

Material Analysis in the News News for October 2013 Each month we highlight material analysis stories that have been covered in the press. Read more >

Scientific Book Review Marketing for Scientists – How to Shine in Tough Times Reading this book will give you insights into how you can successfully promote your research and your standing as a scientist with complete integrity. The author (Marc J. Kuchner) has approached this issue by studying classic and modern marketing techniques and relating the impact of their usage on the career and body of work for scientists competing in today’s tough scientific environment. Read more >

Recent Scientific Papers of Interest

Study of InAs/InAsSb type-II superlattices using high-resolution x-ray diffraction and
cross-sectional electron microscopy. Shen, Xiao-Meng; Li, Hua; Liu, Shi; Smith, David J.; Zhang, Yong-Hang. Journal of Crystal Growth. Oct2013, Vol. 381, p1-5. 5p.
DOI: 10.1016/j.jcrysgro.2013.06.021.

Reverse Monte Carlo modeling of the neutron and X-ray diffraction data for new chalcogenide Ge–Sb–S(Se)–Te glasses. Fabian, M.; Svab, E.; Pamukchieva, V.; Szekeres, A.; Todorova, K.; Vogel, S.; Ruett, U. Journal of Physics & Chemistry of Solids. Oct2013, Vol. 74 Issue 10, p1355-1362. 8p. DOI: 10.1016/j.jpcs.2013.05.011.

Pure Hydroxyapatite Phantoms for the Calibration of in Vivo X-ray Fluorescence Systems of Bone Lead and Strontium Quantification. Da Silva, Eric; Kirkham, Brian; Heyd, Darrick V.; Pejović-Milić, Ana. Analytical Chemistry. 10/1/2013, Vol. 85 Issue 19, p9189-9195. 7p.
DOI: 10.1021/ac401877d.

Analytical possibilities of different X-ray fluorescence systems for determination of trace elements in aqueous samples pre-concentrated with carbon nanotubes. Marguí, E.; Zawisza, B.; Skorek, R.; Theato, T.; Queralt, I.; Hidalgo, M.; Sitko, R. Spectrochimica Acta Part B. Oct2013, Vol. 88, p192-197. 6p. DOI: 10.1016/j.sab.2013.07.004.

Raman and X-ray diffraction study of (Ba,Sr)TiO₃/(Bi,Nd)FeO₃ multilayer heterostructures. Anokhin, A.S.; Bunina, O.A.; Golovko, Yu I.; Mukhortov, V.M.; Yuzyuk, Yu I.; Simon, P. Thin Solid Films. Oct2013, Vol. 545, p267-271. 5p. DOI: 10.1016/j.tsf.2013.08.057.

X-ray fluorescence imaging of single human cancer cells reveals that the N-heterocyclic ligands of iodinated analogues of ruthenium anticancer drugs remain coordinated after cellular uptake. Antony, Sumy; Aitken, Jade; Vogt, Stefan; Lai, Barry; Brown, Tracey; Spiccia, Leone; Harris, Hugh. Journal of Biological Inorganic Chemistry. Oct2013, Vol. 18 Issue 7,
p845-853. 9p. DOI: 10.1007/s00775-013-1027-z.

In-situ energy dispersive x-ray diffraction study of the growth of CuO nanowires by
annealing method. Srivastava, Himanshu; Ganguli, Tapas; Deb, S. K.; Sant, Tushar; Poswal, H. K.; Sharma, Surinder M. Journal of Applied Physics. Oct2013, Vol. 114 Issue 14, p144303. 8p. 2 Black and White Photographs, 4 Graphs. DOI: 10.1063/1.4824177.

Investigation of a LiCl–KCl–UCl₃ system using a combination of X-ray diffraction and differential thermal analyses. Nakayoshi, Akira; Kitawaki, Shinichi; Fukushima, Mineo; Murakami, Tuyoshi; Kurata, Masaki. Journal of Nuclear Materials. Oct2013, Vol. 441 Issue 1-3, p468-472. 5p. DOI: 10.1016/j.jnucmat.2013.06.019.

Characterization of the structural and optical properties of CuIn_1-xGa_xSe₂ QJ;thin films
by X-ray diffraction. Wu, Ya-Fen; Hsu, Hung-Pin; Chen, Hung-Ing. Journal of Luminescence. Oct2013, Vol. 142, p81-85. 5p. DOI: 10.1016/j.jlumin.2013.03.046.

High-energy-resolution grazing emission X-ray fluorescence applied to the characterization of thin Al films on Si. Kayser, Y.; Szlachetko, J.; Banaś, D.; Cao, W.; Dousse, J.-Cl.; Hoszowska, J.; Kubala-Kukuś, A.; Pajek, M. Spectrochimica Acta Part B. Oct2013, Vol. 88, p136-149. 14p.
DOI: 10.1016/j.sab.2013.06.011.

X-ray diffraction study of the reverse martensitic transformation in NiTi shape memory thin films. Koker, M.K.A.; Schaab, J.; Zotov, N.; Mittemeijer, E.J. Thin Solid Films. Oct2013, Vol. 545, p71-80. 10p. DOI: 10.1016/j.tsf.2013.07.033.

High energy X-ray diffraction measurement of residual stresses in a monolithic aluminum clad uranium–10 wt% molybdenum fuel plate assembly. Brown, D.W.; Okuniewski, M.A.; Almer, J.D.; Balogh, L.; Clausen, B.; Okasinski, J.S.; Rabin, B.H. Journal of Nuclear Materials. Oct2013, Vol. 441 Issue 1-3, p252-261. 10p. DOI: 10.1016/j.jnucmat.2013.05.064.

Determination of non-uniform graphene thickness on SiC (0 0 0 1) by X-ray diffraction. Ruammaitree, A.; Nakahara, H.; Akimoto, K.; Soda, K.; Saito, Y. Applied Surface Science. Oct2013, Vol. 282, p297-301. 5p. DOI: 10.1016/j.apsusc.2013.05.122.

Direct quantification of TiO₂ nanoparticles in suspension by grazing-incidence X-ray fluorescence spectrometry: Influence of substrate pre-treatment in the deposition process. Motellier, S.; Derrough, S.; Locatelli, D.; Amdaoud, M.; Lhaute, K. Spectrochimica Acta Part B. Oct2013, Vol. 88, p1-9. 9p. DOI: 10.1016/j.sab.2013.07.003.

Determination of dopant concentration in co-deposited organic thin films by using RBS and
X-ray fluorescence combined techniques. Paredes, Y.A.; Gravina, E.G.; Barbosa, M.D.; Machado, R.; Quirino, W.G.; Legnani, C.; Cremona, M. Optical Materials. Oct2013, Vol. 35 Issue 12, p2440-2443. 4p. DOI: 10.1016/j.optmat.2013.06.049.

Multilayered samples reconstructed by measuring K_α/K_β or L_α/L_β X-ray intensity ratios by EDXRF. Cesareo, Roberto; de Assis, Joaquim T.; Roldán, Clodoaldo; Bustamante, Angel D.; Brunetti, Antonio; Schiavon, Nick. Nuclear Instruments & Methods in Physics Research Section B. Oct2013, Vol. 312, p15-22. 8p. DOI: 10.1016/j.nimb.2013.06.019.

Residual stress analysis of diamond-coated WC-Co cutting tools: separation of film and substrate information by grazing X-ray diffraction. Meixner, M.; Klaus, M.; Genzel, Ch.; Reimers, W. Journal of Applied Crystallography (International Union of Crystallography – IUCr). Oct2013, Vol. 46 Issue 5, p1323-1330. 8p. DOI: 10.1107/S0021889813020451.

Structure-induced negatively skewed X-ray diffraction pattern of carbon onions. Siklitskaya, Alexandra; Yastrebov, Sergey; Smith, Roger. Journal of Applied Physics. Oct2013, Vol. 114 Issue 13, p134305-134305-4. 1p. 3 Graphs. DOI: 10.1063/1.4824286.

Curium analysis in plutonium uranium mixed oxide by x-ray fluorescence and absorption fine structure spectroscopy. Degueldre, C.; Borca, C.; Cozzo, C. Talanta. Oct2013, Vol. 115, p986-991. 6p. DOI: 10.1016/j.talanta.2013.06.021.

Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction. Jongsukswat, Sukswat; Fukamachi, Tomoe; Ju, Dongying; Negishi, Riichirou; Hirano, Keiichi; Kawamura, Takaaki. Journal of Applied Crystallography (International Union of Crystallography – IUCr). Oct2013, Vol. 46 Issue 5, p1261-1265. 5p.
DOI: 10.1107/S0021889813019067.

Determination of Young’s modulus and Poisson’s ratio of thin films by X-ray methods. Fu, Wei-En; Chang, Yong-Qing; He, Bo-Ching; Wu, Chung-Lin. Thin Solid Films. Oct2013, Vol. 544, p201-205. 5p. DOI: 10.1016/j.tsf.2013.03.121.

Quantification of total element concentrations in soils using total X-ray fluorescence spectroscopy (TXRF). Towett, Erick K.; Shepherd, Keith D.; Cadisch, Georg. Science of the Total Environment. Oct2013, Vol. 463-464, p374-388. 15p. DOI: 10.1016/j.scitotenv.2013.05.068.

Thermal expansion of manganese dioxide using high-temperature in situ X-ray diffraction. Dose, Wesley M.; Donne, Scott W. Journal of Applied Crystallography (International Union of Crystallography – IUCr). Oct2013, Vol. 46 Issue 5, p1283-1288. 6p.
DOI: 10.1107/S0021889813017846.

Spectroscopy of the anomalous scattering and transport of the X-ray fluorescence inside hollow microcapillaries. Mazuritskiy, M.; Lerer, A.; Novakovich, A.; Vedrinskii, R. JETP Letters. Oct2013, Vol. 98 Issue 3, p130-133. 4p. DOI: 10.1134/S0021364013160108.

X-ray residual stress analysis on multilayer systems: an approach for depth-resolved data evaluation. Klaus, Manuela; Genzel, Christoph. Journal of Applied Crystallography (International Union of Crystallography – IUCr). Oct2013, Vol. 46 Issue 5, p1266-1276. 11p.
DOI: 10.1107/S0021889813018517.

Physical properties of sublimated zinc telluride thin films for solar cell applications. Shah, Nazar Abbas; Mahmood, Waqar. Thin Solid Films. Oct2013, Vol. 544, p307-312. 6p.
DOI: 10.1016/j.tsf.2013.03.088.