Rigaku to Sponsor European Conference on X-Ray Spectrometry

Rigaku is featuring its latest X-ray analytical technologies at the 2016 European Conference on X-ray Spectrometry

June 16, 2016 – The Woodlands, TX. Rigaku Corporation is pleased to announce its attendance at the European Conference on X-ray Spectrometry (EXRS2016). The event will be held on June 19-24, 2016 at the Conference Centre Wallenberg at the University of Gothenburg.

This conference has become a traditional meeting for scientists from around the world working in X-ray spectrometry or using its associated techniques, and offers an engaging discussion forum for basic research and applications of X-ray spectrometry in a variety of fields.

Rigaku is presenting its current line of X-ray fluorescence (XRF) products and technologies, and will be introducing the next generation Rigaku NANOHUNTER II benchtop total reflection X-ray fluorescence (TXRF) spectrometer. The new spectrometer enables high-sensitivity ultra-trace elemental analysis, in liquids or on solid surfaces, to the parts-per-billion (ppb) level, and combines a fully automatic optical axis adjustment system that provides stable high-sensitivity analysis in a convenient benchtop form factor.

Additional services and X-ray equipment from Rigaku will be presented by RAMCON. RAMCON is a focused distributor offering service and support for X-ray fluorescence and diffraction products from Rigaku.