Rigaku to exhibit latest X-ray analytical instrumentation at 2016 Denver X-ray Conference

Rigaku will be in attendance at the 65th Annual Conference on Applications of X-ray Analysis to showcase its XRD and XRF spectrometers

July 29, 2016 – Tokyo, Japan. Rigaku Corporation, a global leader in X-ray analytical instrumentation, will be presenting its diverse lines of X-ray analytical instrumentation at the 2016 Denver X-ray Conference® (DXC 2016). The 65th Annual Conference on Applications of X-ray Analysis will take place Monday, August 1, 2016 through Friday, August 5, 2016 at the Westin O’Hare Hotel in Rosemont, Illinois, USA.

Rigaku will be exhibiting its diverse range of X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation in the South Foyer at Booth numbers 39, 40, 41, 42. On display will be the Rigaku SmartLab intelligent X-ray diffraction (XRD) system, a multi-purpose, high-resolution diffractometer. The SmartLab® system is designed for all XRD applications, from powder and thin film diffraction to SAXS and in-plane scattering. The SmartLab Guidance software provides an intelligent interface that guides users through each experiment.

Also featured will be the Rigaku MiniFlex benchtop X-ray diffractometer. Ideally suited for today's fast-paced XRD analyses, the fifth generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. It delivers speed and sensitivity through innovative technology enhancements, such as the optional D/teX high speed detector, coupled with a 600 W X-ray source.

The Rigaku Supermini200 is the only commercially available benchtop wavelength dispersive X-ray fluorescence (WDXRF) spectrometer. It features newly designed and simplified software and an improved footprint.

Energy dispersive X-ray fluorescence (EDXRF) spectrometers to be presented include the Rigaku NEX CG Cartesian-geometry EDXRF spectrometer, a powerful analyzer designed to deliver rapid qualitative and quantitative determination of major and minor atomic elements across a wide variety of sample types.

X-ray and EUV optics products from Rigaku's Innovative Technology division will be featured as well. Rigaku's multilayer optics are in use in a broad array of X-ray spectrometers and diffractometers worldwide.

Workshops will take place throughout the conference and will include presentations from Rigaku covering topics such as Trace Analysis, Quantitative Analysis, and Two-dimensional Detectors.

A Monday evening XRD Poster Session will be held from 5:00 pm – 7:00 pm and will feature:

• Characterization of NiAl Thin Films Using SmartLab Diffractometer
• The New MicroMax-003F Microfocus Source for X-ray Analysis