September 14, 2016 – Rosemont, IL. Applied Rigaku Technologies, Inc. (ART), a division of Rigaku Corporation, is presenting its Energy Dispersive X-ray Fluorescence (EDXRF) elemental analysis instrumentation at Labelexpo Americas 2016, held September 13 - 15, 2016 at the Donald E. Stephens Convention Center in Rosemont IL, USA.
X-ray fluorescence (XRF) is a standard technique across the paper industry used to determine oxide concentrations, coating thickness & composition, as well as other important paper chemistries that other technologies cannot measure. Featured instrumentation from ART includes the Rigaku NEX QC series of benchtop EDXRF spectrometers and the Rigaku NEX OL EDXRF process analyzer.
NEX QC Series
The NEX QC series of low-cost compact elemental energy dispersive X-ray fluorescence (EDXRF) analyzers from Rigaku offers rapid quantitative EDXRF analysis for silicone coated paper and films.
Paper and plastic is often coated with a thin layer of silicone as a release coating in the manufacture of tape or other adhesives, or as a barrier coating. During the coating process the amount of silicone coating must be periodically measured in order to ensure that the proper physical properties of the product are maintained. When coating is too heavy, silicone material is needlessly wasted, while too little coating may not meet the product specifications.
In order to achieve reliable QA/QC, Rigaku offers the NEX QC EDXRF spectrometer. Simple to operate, the NEX QC analyzer gives the QC technician an ideal tool for quickly checking silicone coat weight in order to maintain the highest product quality with minimal costs.
Specifically designed for routine quality control elemental analysis applications, the Rigaku NEX QC analyzer features an intuitive "icon-driven" touchscreen interface for easy operation, and a built-in printer for convenience.
For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ provides exceptional repeatability and long-term reproducibility with excellent element peak resolution, resulting in superior calibrations and precision for the most challenging measurements.
The NEX QC series delivers rapid and precise analysis with no sample preparation. Metallic coatings, either electroplated or sputtered onto some substrate material, may also be quantified with NEX QC series.
The Rigaku NEX OL EDXRF process analyzer
On-line, real-time elemental analysis
For on-line, real-time multi-element analysis of process liquids or of coating thickness and elemental composition in web and coil applications, Rigaku presents the NEX OL energy dispersive X-ray fluorescence (EDXRF) process analyzer. Featuring advanced third generation EDXRF technology, including a 50 kV X-ray tube and an SDD detector—together with a standardized, optimized suite of tube filters—the Rigaku NEX OL is engineered to solve a wide variety of process control applications, including analyses of coatings for paper and plastics, with superior analytical performance and reliability.
The NEX OL analyzer offers fast and precise results for both at-line coating weight determination and off-line analysis. For these analyses, a head can simply be mounted in a fixed position over a roller, ensuring that the head-to-surface distance remains constant
For further information, contact:
Robert P. Bartek
President
Applied Rigaku Technologies
(+1) 512-225-1796
info@RigakuEDXRF.com