Rigaku to showcase latest X-ray analytical instrumentation at GSA 2016

Rigaku will present its latest XRD and XRF technology at the 2016 Geological Society of America conference

September 21, 2016 – The Woodlands, TX. Rigaku Corporation will be presenting its diverse lines of X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation at GSA 2016, the Geological Society of America conference. The conference hosts geological scientists from academic, government, business, and industry sectors and will take place Sunday, September 25, 2016 through Wednesday, September 28, 2016 at the Colorado Convention Center in Denver, Colorado.

X-ray analysis techniques are routinely employed in geological research. Wavelength dispersive XRF instrumentation enables chemical composition mapping by use of small analyzing areas and an XY-stage enabling multiple measurements of a sample. XRD is utilized to quantitatively measure phase composition. For quantitative crystalline phase determination, Rietveld analysis of X-ray diffraction data is among the most powerful methods available. Rigaku technology and expertise provide many valuable, effective solutions for these types of analyses.

Rigaku is a global leader in X-ray analytical instrumentation, manufactures XRD & XRF instruments for research, testing, industrial process control, and product development and will be exhibiting at the conference at booth #259.

Among the instruments presented will be the Rigaku MiniFlex benchtop X-ray diffractometer. Ideally suited for today's fast-paced XRD analyses, the fifth generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. It delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high speed detector coupled with a 600 W X-ray source.

More information about geological and mineralogical analysis solutions from Rigaku is available at http://www.rigaku.com/en/industry/geology