Intelligent X-ray diffraction system

Powder diffraction, thin film diffraction, SAXS, in-plane scattering

SmartLab®

The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side.

Engineered for Performance

The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.

Designed for Flexibility

Coupling a computer controlled alignment system with a fully automated optical system and the Guidance software makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.

Functionality Redefined

Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the functionality to make the measurements you want to make when you want to make them.

 

Features

  • Full automated alignment under computer control.
  • Optional in-plane diffraction arm for in-plane measurements without reconfiguration.
  • Focusing and parallel beam geometries without reconfiguration.
  • SAXS capabilities.

SmartLab specifications

Sealed tube generator Maximum rated output 3 kW
Rated tube voltage - current 20 - 60 kV; 2 - 60 mA
Stability Within ±0.005% for 10% input power variation
Target Cu (others: optional)
Focus size 0.4 x 12 mm line/point (others: optional)
Radiation enclosure Full safety shielding with failsafe open/close mechanism
Rotating anode generator Maximum rated output 9 kW
Rated tube voltage - current 20 - 45 kV; 10 - 200 mA
Stability Within ±0.005% for 10% input power variation
Target Cu (others: optional)
Focus size 0.4 x 8 mm line/point
Radiation enclosure Full safety shielding with fail safe open/close mechanism
Goniometer Scanning mode θs/θd coupled or θs, θd independent optical encoder controlled
Goniometer radius 300 mm
Minimum step size 0.0001°
Eulerian cradle χ: -5 to 95°/0.001° step
φ: -720 to 720°/0.002° step
Ζ: -4 to 1 mm/0.0005 mm step
Optional X, Y stages: 20 mm/0.0005 mm step, 100 mmφ/0.0005 mm step, 150 mmφ/0.0005 mm step
Optional Rx, Ry stage: -5 to 5°/0.002° step
Sample size Max. 200 mmφ x 6 mm thick (24 mm thick, optional)
Optics Incidence optics CBO, Ge 2-bounce and 4-bounce monochromators, automatic variable divergence slit
Receiving optics Automatic variable scattering slit PSA, Ge 2-bounce analyzer, automatic variable receiving slit
Detector Scintillation counter Scintillator NaI, photomultiplier with preamplifier

 

Description
HyPix-3000 Hybrid Pixel Array Detector

2D semiconductor detector with large active area (approx. 3000 mm²), small pixel size (100 μm²), ultra-high dynamic range, high sensitivity, and XRF suppression by high and low energy discrimination. Seamless switching from 2D-TDI (Time Delay and Integration) mode to 2D snapshot mode to 1D-TDI mode to 0D mode with a single detector.

D/teX Ultra 250

The D/tex Ultra 250 is a 1D silicon strip detector that decreases data acquisition time by almost 50% compared to competitive detectors. This is achieved by increasing the active area of the aperture and thus increasing the count rate. Compared to the previous model, the D/teX Ultra, has a smaller pixel pitch (0.075mm) and is longer in the direction of 2θ. For researchers who are interested in the lowest XRF suppression possible, the combination of an optional receiving monochromator and low-enrgy discrimination offer outstanding suppression.

The D/teX Ultra 250 is designed for the SmartLab diffractometer, Rigaku's most innovative diffraction product.

D/tex Ultra HE

The D/teX Ultra HE is a special silicon strip detector that is optimized for high energy X-ray work by utilizing a thicker detector material. For Cr, Fe, Co, and Cu, the efficiency is approximately 99%. With Mo radiation the efficiency is approximately 70%.

Mapping Stage

Allows xy positioning of the sample in the X-ray beam. 20 mm, 50 mm, and 75 mm translations available.

RxRy Tilt Stage

Allows xy positioning of the sample in the X-ray beam. 20 mm, 50 mm, and 75 mm translations available.

Secondary Monochromator

The optional secondary monochromator can be used with the D/teX Ultra 250 silicon strip detector for outstanding energy resolution. If the D/teX Ultra 250 is used in conjunction with the secondary monochromator an energy resolution of 320 eV is achieved, or 4% with CuKα.

Anton Paar DCS 350 Domed Cooling Stage

Sample cooling and heating stage with spherical X-ray window for in-situ texture and thin film analysis. Compact and light-weight stage with liquid nitrogen sample cooling.
Temperature range: -100 °C to 350 °C
Atmospheres: air, inert gas, vacuum(10⁻¹ mbar)

Anton Paar DHS 1100 Domed Hot Stage

Sample heating stage with spherical X-ray window for in-situ texture and thin film analysis. Compact and light-weight stage with air-cooling.
Temperature range: 25 °C to 1100°C
Atmospheres: air, inert gas, vacuum(10⁻¹ mbar)

Anton Paar HTK 1200N High-Temperature Oven Chamber

High-temperature heating stage for powders and polycrystalline solid samples. Heating to 1200 °C in air and vacuum possible.

Main features:

  • furnace heater for good temperature uniformity
  • sample spinning for good data quality
  • capillary option for transmission XRD
  • easy sample loading

Temperature range: 25 °C to 1200 °C
Atmospheres: air, inert gas, vacuum(10⁻⁴ mbar)

Anton Paar HTK 16N High-Temperature Chamber

High-temperature sample heating stage with strip heater for powder diffraction. Allows for very fast heating and cooling and ensures high sample position stability with heating strip pre-stressing.

Temperature range:

with Pt-strip: 25 °C to 1600 °C in air, vacuum
with Ta and C-strip: 25 °C to 1500 °C in vacuum

Atmospheres: air, inert gas, vacuum(10⁻⁴ mbar)

Anton Paar HTK 2000N High-Temperature Chamber

High-temperature sample heating stage with strip heater for powder XRD of refractory materials. The use of a tungsten strip offers extremely high temperature and fast heating and cooling, the strip pre-stressing mechanism ensures high sample position stability.

Temperature range:

with W-strip: 25 °C to 2300 °C in vacuum
with Pt -strip: 25 °C to 1600 °C in air, vacuum

Atmospheres: vacuum(10⁻⁴ mbar), inert gas, air

Anton Paar TTK 450 Low Temperature Chamber

Sample cooling and heating stage with liquid nitrogen cooling. Large temperature range and ease of use for a wide range of applications. With beam knife and optional zero background sample holder for investigation of organic materials at low 2θ angles.

Temperature range: -193 °C to 450 °C
Atmospheres: air, inert gas, vacuum(10⁻² mbar)

PDXL is a one-stop full-function powder diffraction analysis software suite. The modular design, advanced engine and user-friendly GUI have been satisfying both experienced and novice users since PDXL was released in 2007.

PDXL provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc.

Fundamental parameter method

The peak shape in a powder diffraction pattern would appear to be a delta function if measured under ideal conditions. In reality, the peak shape changes depending on a number of measurement conditions: wavelength distribution of the source, optical systems, slit conditions, crystallite size and strain, and so on. The peak shapes obtained from measurements made under real-world conditions are described using an empirical function such as a split pseudo-Voigt function, or a split Pearson VII function which has a good agreement with the obtained peak shapes. The fundamental parameter method (FP method) is a method to calculate peak shape by convolution of the shapes caused by all the instrumental and sample conditions.

Phase identification using COD

The Crystallography Open Database (COD) is a free, public-domain database of the crystal structures published in International Union of Crystallography, Mineralogical Society of America and so on. PDXL can incorporate both ICDD/PDF-2 and COD to perform automatic phase identification, adding the COD library of over 150,000 crystal structures to PDXL 2’s already substantial capabilities.
Wizard for ab initio crystal structure analysis
Recently, there have been many published examples of ab initio crystal structure analysis performed on powder diffraction data. This development is attributed primarily to significant improvements in PC processing speed and in the efficiency of the algorithms used for structure determination.

PDXL has so far provided all of the functions required for ab initio crystal structure analysis, such as indexing, structure determination and structure refinement by the Rietveld method. Now the “Structure Analysis Wizard” is available in PDXL to provide support and guidance for users undertaking the complicated procedure of structure analysis, particularly of organic compounds. This wizard system will make it possible for even the beginner to achieve analytical success

Clustering function
The PDXL clustering feature can group multiple scan data based on the similarity of powder diffraction patterns and peak positions, and displays the grouped data in an easy-to-read tree. This is particularly effective when it comes to classifying and screening the data from a large number of scans.

  • Search/Match analysis with PDF-2 and Crystallography Open Database
  • Quantitative analysis
  • Percent crystallinity
  • Crystallite size and strain
  • Cell refinement
  • Residual stress
  • Indexing
  • Whole pattern profile fitting
  • Ab initio structure solving with wizard

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