Espectrômetro de fluorescência de raio X dispersivo de comprimento de onda

WDXRF de alto desempenho para uma rápida análise elementar quantitativa

ZSX Primus

O Rigaku ZSX Primus oferece uma determinação quantitativa rápida de elementos atômicos grandes e pequenos, desde o berílio (Be) ao urânio (U), em uma ampla variedade de tipos de amostra - com padrões mínimos.

Análise elementar poderosa, flexível e confiável

O moderno instrumento na série ZSX da Rigaku, o ZSX Primus, continua a tradição de proporcionar resultados acurados de maneira oportuna e uniforme, com uma confiabilidade inigualável, flexibilidade e facilidade de uso para atender a quaisquer desafios no laboratório atual.

Desempenho de baixo Z com mapeamento e análise multiponto

Oferecendo um desempenho superior com a flexibilidade de análise de amostras mais complexas, o ZSX Primus apresenta um tubo de 30 mícron, a janela mais fina disponível na indústria, para limites excepcionais de detecção de elemento leves (baixo Z). Combinado ao pacote de mapeamento mais avançado para detectar a homogeneidade e as inclusões, o ZSX Primus permite uma fácil investigação detalhada das amostras que fornecem insights analíticos que não são facilmente obtidos por outras metodologias analíticas. Uma análise multiponto disponível também ajuda a eliminar erros de amostragem em materiais não homogêneos.

Parâmetros fundamentais de SQX com um software de varredura EZ

A varredura EZ permite que os usuários analisem amostras desconhecidas sem uma configuração prévia. Esse recurso que economiza tempo exige apenas alguns cliques do mouse e um nome de amostra que será inserido. Combinado ao software de parâmetros fundamentais de SQX, fornece o os resultados de XRF mais exatos e rápidos possíveis. SQX é capaz de corrigir automaticamente todos os efeitos de matriz, incluindo as sobreposições de linhas. SQX também pode corrigir um efeito secundário de excitação por fotoelétrons (elementos leves e ultra-leves), variando atmosferas, impurezas e diferentes tamanhos de amostra. O aumento da exatidão é obtido ao usar uma biblioteca de correspondência e programas de análise de varredura perfeita.

ZSX Primus
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Features

  • Análise de elementos que vão do Be ao U
  • A pequena base usa um espaço menos valioso de laboratório
  • Microanálise para analisar amostras tão pequenas quanto 500 μm
  • O design do tubo inferior é otimizado para líquidos e pós soltos
  • O tubo de 30 μ oferece um desempenho superior do elemento leve
  • Recurso de mapeamento para topografia/distribuição elementares
  • A vedação de hélio significa que a óptica está sempre sob vácuo

ZSX Primus specifications

General

Elemental coverage
₄Be through ₉₂U

Optics
Wavelength dispersive, sequential, tube below
X-ray generator

X-ray tube
End window, Rh-anode, 3kW or 4 kW, 60kV

HV power supply
High frequency inverter, ultra-high stability

Cooling
Internal water-to-water heat exchanger
Spectrometer

Sample changer
48 positions standard, 104 SSLS optional

Sample inlet
Air lock system

Maximum sample size
51 mm (diameter) by 30 mm (high)

Sample rotation speed
30 rpm

Primary X-ray filters
Al25, Al125, Ni40, Ni400 and Be (optional, for window protection)

Beam collimators
6 auto-selectable diameters: 35, 30, 20, 10, 1 and 0.5 mm
27 mm can be selected instead of 30 mm for SSLS

Divergence slit
3 auto-selectable: standard, high, and coarse (optional) resolutions

Receiving slit
For SC and for F-PC detectors

Goniometer
θ – 2θ independent drive mechanism

Angular range
SC: 5-118°, F-PC: 13-148°

Angular reproducibility
Ultra-high precision

Continuous scan
0.1 - 240°/min

Crystal changer
10 crystals, automatic mechanism

Vacuum system
2 pump high-speed system w/ (optional) powder trap

He flush system
Optional, with partition
Detector systems

Heavy element detector
Scintillation counter (SC)

Light element detector
Flow proportional counter (F-PC)

Attenuator
In-out automatic exchanger (1/10)

Smart Sample Loading System

Rigaku’s new Smart Sample Loading System (SSLS) adds a new dimension of flexibility to the ZSX Primus WDXRF spectrometer. For sample types that are amenable to such a process, a vacuum chuck can be used to load samples into pre-loaded sample holders. This sample loading system has two important consequences: time is saved by the operator since they are no longer required to manually load each sample in a sample cup and the number of samples that can be held on the sample deck is increased significantly

Permissible sample types

Rigaku’s SSLS can handle samples up to 50 grams in weight and the modular sample deck racks have been designed for different sample diameters. Samples with a diameter of 35 mm can be stored 32 samples to a rack with three such racks sitting on the deck. Samples with a diameter of 40 mm can be stored 24 samples to a rack with a possibility of three of these racks on the deck. In addition, the racks can be mixed so that different sample sizes are easily accommodated on the deck at the same time. Sample types that are amenable to this type of loading procedure include fused glass beads and pressed powders. Both plastic and metal pressed powder holders are permitted.

Sample handling

A precision vacuum chuck is used to safely and reproducibly pick up the samples and place them in the measurement sample holder. Each sample type has a specific sizing ring positioned in the measurement sample holders to assure that the sample is properly positioned for measurement, and the analytical reading surface is never compromised.

Sample tracking

Keeping track of samples has never been easier. A two-dimensional barcode can be attached to the non-analysis surface of each sample. Before the sample is lowered into the pre-evacuation chamber through the input port, the barcode is scanned and the sample information is loaded into the control software.

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Smart Sample Loading System
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Features

  • Increasesthe number of samples on deck
    • The maximum number of samples that can be loaded in the same installation space as compared to the conventional sample changer has been increased from 48 to 104 units (when ∅35mm sample trays are used)
  • Flexible combination of sample trays
    • It is possible to combine various sample trays (the sample trays for the standard sample holder, for ∅35mm sample size and ∅40mm sample size) in various combinations with a simple software operation for deck configuration.
  • Automated analysis interface provided
    • By communicating with the automated analytical system control computer, the sample set at the sample transfer position is measured automatically.
  • Significantly reduces labor requirements and improves accuracy
    • With integrated barcode reader (option), labor requirements are reduced and data transcription accuracy increased.
If you are unable to view this video, click here to download it (315 MB).

ZSX Primus overview

  • Qualitative analysis:
    • Automatic peak identification
    • Smoothing, background subtraction
  • Quantitative analysis:
    • Matrix correction: Lachance-Traill, DeJohngh, JIS, etc.
    • Linear, quadratic and cubic regression, multiple line
    • Fundamental parameter method
  • EZ scan (qualitative)
  • Application template
  • Analysis area automatic selection (mask size detection)
  • Peak deconvolution (function and standard profile)
  • Background fitting (multi-point function fitting, area designation)
  • Fixed precision analysis
  • Help function
  • E-mail forwarding function
  • Universal standard sample
  • Analysis simulation program (analysis depth evaluation, etc.)

Optional:

  • SQX program:
    • EZ scan (SQX)
    • Fixed angle measurement
    • Thin-film analysis
    • Theoretical overlap correction
    • Drift correction library
    • Photoelectron FP method
    • He atmosphere correction
    • Sample film correction:
      • Impurity correction
      • Matching library
      • SQX scatter FP method
      • Material judgment
  • Quantitative scatter FP method
  • Quantitative FP theoretical overlap correction
  • Fusion disk correction (flux evaporation)
  • Charge correction
  • Program operation:
    • Time preset analysis
    • Energy saving
    • Auto power off
  • Sample observation mechanism
  • Point/mapping function
  • Remote control function (VCP)