Ultima IV

Rigaku's introduction of the Ultima IV has once again shown the responsiveness Rigaku has to the changing world of materials analysis. The addition of SAXS and in-plane measurement capabilities as options for a standard θ:θ instrument is revolutionary. No longer does a laboratory need to purchase two instruments or venture to the synchrotron for these measurements.

The SAXS option was added in response to those researchers performing nanoparticle measurements. In order to better understand the complete morphology of a nanoparticle system, both the wide and small angle X-ray portions of the scattering curves need to be measured. The SAXS portion is used in determining long periods spacing which include particle-particle interactions and particle size. The wide angle portion is used in determining the crystallographic phase, crystallite size, percent crystallinity, etc. Both these measurements as well as other analytical techniques such as EM, AFM, and laser light scattering help characterize the physical dimensions of the nanoparticle systems. The SAXS option is also extended to reflection modes to investigate particle/pore sizes in thin films on substrates including liquid surfaces.

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