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VSEE300
XRR tools
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With decades of global market leadership in the semiconductor industry, our families of products enable everything from in-fab process control metrology to R&D for thin film and materials characterization.

Rigaku specializes in making TXRF, XRF, XRD and XRR metrology tools to measure critical process parameters from contamination to thin film thickness, composition, roughness, density, porosity, and crystal structure. 

With global 24/7 service and support, Rigaku delivers cutting edge solutions for yield enhancement and process development.

   
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VSEE300
VSEE300
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VSEE300 standalone VPD system

Rigaku's VSEE300 is an automated vapor phase decomposition (VPD) tool to decompose the surface of a Si wafer and concentrate contaminants in a droplet in preparation for TXRF, ICP-MS, or AAS analysis.

Features

  • Minimum footprint
  • High throughput
  • Designed for chemical safety and ease of routine maintenance
  • Fully automated operation (decomposition, droplet recovery, drying)
  • Flexible VPD treatment parameters
  • Whole wafer, ring, and fan scan types
  • 150mm, 200mm, and 300mm wafer capable
  • Ability to extract sample solution for ICP-MS and AAS analyses
  • Ability to dry concentrated droplets for TXRF analysis
  • VPD enables a 100-fold TXRF detection limit improvement