Powder and thin film XRD applications
- RAPID II
- Microdiffraction
- X-ray microdiffraction for residual stress determination
- Percent crystallinity of polymers
- Texture strength representation as fiber texture plots
- X-ray microdiffraction of the crystalline structure forming a tooth
- Compression studies on wood
- Comparing cellulose in Sitka spruce and in celery
- Solution structures and precrystallisation molecular association
- Crystallization of a rubber band by stretching
- Ununiform crystalline state of a PET bottle
- MiniFlex™ II
- Duct tape specimens
- Non-destructive failure analysis
- Validating minting ages of coins
- RIR-based quantitative phase analysis of crystal polymorphism
- General XRD phase/composition identification analysis
- Forensic analysis by X-ray diffraction
- Fast phase analysis of mineral powders
- XRD characterization of refractory powders by Search/Match analysis
- Quantification of the alpha-to-beta brass ratio in wire coatings
- What's in your pastry?
- Phase identification in the oil drilling industry
- Zeolite—Impurities and Phase Identification
- Composition of barite: A universal material
- Scales in the petroleum industry: Phase identification
- Chocolate or cocoa? X-ray diffraction: General comparisons
- Retained austenite analysis
- Chocolate: Phase ID
- Quantification of Zeolite phases
- Phase identification of a forensic sample
- Quality control in industrial processes with phase identification
- What do greenhouse gases, pearls, antacids, lasers, cement and sea shells have in common?
- Forensic vehicle identification from paint samples
- Talc? I don't think so...Whole Pattern Fitting
- Bringing XRD experiments into the teaching laboratory
- X-ray diffraction of an over-the-counter pain medication
- Shale vs. slate XRD identification—know your slate or pay dearly
- Respirable silica (alpha quartz) measurements
- Identifying very small amounts of (geo)material
- Non-destructive fossil identification of ammonites
- Contamination makes aluminum oxide a priceless gem
- Pancakes
- Identification of an unknown sludge
- Phase Identification of common minerals in natural facial cosmetics
- Quantitative Analysis of Anhydrite
- Phase identification and Rietveld refinement of Connemara (Irish) Marble
- SmartLab®
- In-plane and out-of-plane combined analysis of ZnO on sapphire
- Ceria (CeO2) nanoparticles size distribution analysis
- Rocking curve analysis of AlGaN/GaN on sapphire {101 0} m-plane substrate
- High-resolution X-ray reciprocal space mapping of AlN epifilms on sapphire
- Evaluation of SrTiO3 single crystal substrate by high-resolution X-ray reciprocal space mapping
- Determination of the layer thickness and roughness of polymer films by X-ray reflectivity
- Characterization of an InN epitaxial film on a sapphire substrate by X-ray reciprocal space maping (RSM) and rocking curve (RC) analysis
- Texture analysis of NiW alloy
- Texture of MgO single crystal substrate material
- High-resolution X-ray rocking curve analysis of an SiGe film grown on an Si (001) substrate
- Combined XRD and SAXS analysis of nano-magnetic materials
- Quantitative X-ray analysis of Gd powders in air
- Preferred orientation of carbon nanotubes in polyethylene
- Evaluation of the structure of a high-k gate insulation thin film
- Al-based alloys prepared at different conditions: using an XY stage as an automatic sample c hanger
- Evaluation of a low dielectric constant (Low-k) insulation thin film between layers using gr azing incidence X-ray scattering
- Evaluation of a cobalt magnetic thin film on a hard disk
- Evaluation of the crystal structure of a DVD recording layer
- Evaluation of the next generation magnetic recording media (FePt) by in-plane X-ray diffract ion
- Observing the variation in the depth direction in InN, GaN and GaAs nondestructively
- Measurement of the in-plane reciprocal lattice map of ultra-thin films of ZnO, MgO and sapph ire
- Evaluation of a thin film by the X-ray reflectivity method
- Diffraction measurement of a thin film pentacene for an organic TFT
- Evaluation of the crystallinity (tilt and twist distributions) of a GaN thin film by the X-r ay rocking curve method
- Evaluation of ZnO nanocrystals
- Simultaneous analysis of film thickness, density and surface roughness
- High-speed identification and quantification of Hematite and Magnetite
- Grazing-incidence X-ray diffraction of iridium thin films on Si
- Evaluation of molecular orientation of Cu phthalocyanine thin film on rubbing-processed glas s substrates
- Grazing-incidence small angle X-ray scattering (GISAXS) analysis of pore size distributions in nano-porous silica films
- A joint X-ray reflectivity (XRR) and grazing-incidence small-angle scattering (GISAXS) analy sis of a platinum nanoparticulate film
- Variable-resolution X-ray reflectivity analysis of AlN thin films on sapphire substrate
- Triple-axis X-ray diffraction of SiC thin films on Si (001)
- Residual stress and texture mapping of friction stir welds
- Composition and thickness of epitaxial alloy films
- X-ray reflectivity analysis of thin films
- High-resolution X-ray reciprocal space mapping of epitaxial nanostructures
- Small angle X-ray scattering (SAXS) in the study of Aerogel particles
- Textured thin films
- Ultima IV
- Grazing incidence X-ray diffraction of a molybdenum oxide thin film
- X-ray reflectivity analysis of indium tin oxide thin films on glass
- Small angle X-ray scattering analysis of carbon-supported Pt nanoparticles
- Bentonite- A healing clay!
- The composition of eggshell
- Particle size distribution of Pd on silica
- Rietveld refinement of an urban soil
- Rietveld refinement of a sulfide corrosion powder
- XRR studies on a cellulose film
- Unit cell refinement of Montmorillonite clay using the Rietveld method
- Rietveld refinement of the doped lanthanum fluoride (EuLaF3) lattice
- In-plane pole figures on a steel sample
- Grazing incident X-ray diffraction (GIXRD) and X-ray reflectivity (XRR) studies of a Ni-Mn-Ga material
- Detection of low-level polymorphic impurities in pharmaceuticals
- Reitveld refinements from an as-obtained rock chunk
- Measuring trace amorphous components in a raw drug material
- Structural changes of a Whistler alloy due to heat treatment
- Studying molecular arrays in a liquid crystal
- Analysis of glazing chemicals, paints and a vermilion ink in arts and crafts
- Where is chrysotile (asbestos) in serpentine stone?
- Percent crystallinity of a CuO aerogel
- Particle size distribution of Cu nanoparticles in polyimide film
- Size distribution of CdSe nanoparticles
- Fast, nondestructive measurement of polymorphic impurities in medicinal tablets
- Detailed observation of crystal phase transition of fats occurring over a narrow temperature r ange
- The effects of temperature and atmosphere on the aggregation of platinum nanoparticles
- In-situ high temperature studies of a negative thermal expansion coefficient material, ZrW2O8
- Grazing Incidence X-ray Diffraction (GIXRD) analysis of thin film material
- Small area mapping of a fracture on a TiN material
- High-resolution stress and texture measurements
- High-intensity, high-resolution measurements of well powdered samples
- On-demand in-plane scanning for thin film analysis
- Analysis of thin film materials
- In-situ analysis
- Small angle X-ray scattering (SAXS) measurements of nanomaterials
- Small angle X-ray scattering of nanomaterials
- Contact printed Co/insulator/Co molecular junctions
- Rietveld refinement for a cement sample