SmartLab® application gallery
Click on a title to read a SmartLab application byte
- In-plane and out-of-plane combined analysis of ZnO on sapphire
- Ceria (CeO2) nanoparticles size distribution analysis
- Rocking curve analysis of AlGaN/GaN on sapphire {1010} m-plane substrate
- High-resolution X-ray reciprocal space mapping of AlN epifilms on sapphire
- Evaluation of SrTiO3 single crystal substrate by high-resolution X-ray reciprocal space mapping
- Determination of the layer thickness and roughness of polymer films by X-ray reflectivity
- Characterization of an InN epitaxial film on a sapphire substrate by X-ray reciprocal space maping (RSM) and rocking curve (RC) analysis
- Texture analysis of NiW alloy
- Texture of MgO single crystal substrate material
- High-resolution X-ray rocking curve analysis of an SiGe film grown on an Si (001) substrate
- Combined XRD and SAXS analysis of nano-magnetic materials
- Quantitative X-ray analysis of Gd powders in air
- Preferred orientation of carbon nanotubes in polyethylene
- Evaluation of the structure of a high-k gate insulation thin film
- Al-based alloys prepared at different conditions: using an XY stage as an automatic sample c hanger
- Evaluation of a low dielectric constant (Low-k) insulation thin film between layers using gr azing incidence X-ray scattering
- Evaluation of a cobalt magnetic thin film on a hard disk
- Evaluation of the crystal structure of a DVD recording layer
- Evaluation of the next generation magnetic recording media (FePt) by in-plane X-ray diffract ion
- Observing the variation in the depth direction in InN, GaN and GaAs nondestructively
- Measurement of the in-plane reciprocal lattice map of ultra-thin films of ZnO, MgO and sapph ire
- Evaluation of a thin film by the X-ray reflectivity method
- Diffraction measurement of a thin film pentacene for an organic TFT
- Evaluation of the crystallinity (tilt and twist distributions) of a GaN thin film by the X-r ay rocking curve method
- Evaluation of ZnO nanocrystals
- Simultaneous analysis of film thickness, density and surface roughness
- High-speed identification and quantification of Hematite and Magnetite
- Grazing-incidence X-ray diffraction of iridium thin films on Si
- Evaluation of molecular orientation of Cu phthalocyanine thin film on rubbing-processed glas s substrates
- Grazing-incidence small angle X-ray scattering (GISAXS) analysis of pore size distributions in nano-porous silica films
- A joint X-ray reflectivity (XRR) and grazing-incidence small-angle scattering (GISAXS) analy sis of a platinum nanoparticulate film
- Variable-resolution X-ray reflectivity analysis of AlN thin films on sapphire substrate
- Triple-axis X-ray diffraction of SiC thin films on Si (001)
- Residual stress and texture mapping of friction stir welds
- Composition and thickness of epitaxial alloy films
- X-ray reflectivity analysis of thin films
- High-resolution X-ray reciprocal space mapping of epitaxial nanostructures
- Small angle X-ray scattering (SAXS) in the study of Aerogel particles
- Textured thin films