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The power of powder techniques is such that they have had an impact in most of the major developments in the field of new materials during recent years - with solid electrolytes, high-temperature superconductors, fullerenes, zeolites and giant magnetoresistance materials being obvious examples. As a consequence, powder diffraction has been transformed into one of the most exciting areas in scientific instrumentation.
 
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SmartLab® application gallery

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Textured thin films

Small angle X-ray scattering (SAXS) in the study of Aerogel particles

High-resolution X-ray reciprocal space mapping of epitaxial nanostructures

X-ray reflectivity analysis of thin films

Composition and thickness of epitaxial alloy films

 

Residual stress and texture mapping of friction stir welds

Triple-axis X-ray diffraction of SiC thin films on Si (001)

Variable-resolution X-ray reflectivity analysis of AlN thin films on sapphire substrate

A joint X-ray reflectivity (XRR) and grazing-incidence small-angle scattering (GISAXS) analysis of a platinum nanoparticulate film

Grazing-incidence small angle X-ray scattering (GISAXS) analysis of pore size distributions in nano-porous silica films

Evaluation of molecular orientation of Cu phthalocyanine thin film on rubbing-processed glass substrates

Grazing-incidence X-ray diffraction of iridium thin films on Si

High-speed identification and quantification of Hematite and Magnetite

Simultaneous analysis of film thickness, density and surface roughness

Evaluation of ZnO nanocrystals

Evaluation of the crystallinity (tilt and twist distributions) of a GaN thin film by the X-ray rocking curve method

Diffraction measurement of a thin film pentacene for an organic TFT

Evaluation of a thin film by the X-ray reflectivity method

Measurement of the in-plane reciprocal lattice map of ultra-thin films of ZnO, MgO and sapphire

Observing the variation in the depth direction in InN, GaN and GaAs nondestructively

Evaluation of the next generation magnetic recording media (FePt) by in-plane X-ray diffraction

Evaluation of the crystal structure of a DVD recording layer

Evaluation of a cobalt magnetic thin film on a hard disk

Evaluation of a low dielectric constant (Low-k) insulation thin film between layers using grazing incidence X-ray scattering

Al-based alloys prepared at different conditions: using an XY stage as an automatic sample changer

Evaluation of the structure of a high-k gate insulation thin film

Preferred orientation of carbon nanotubes in polyethylene

Quantitative X-ray analysis of Gd powders in air

Combined XRD and SAXS analysis of nano-magnetic materials

High-resolution X-ray rocking curve analysis of an SiGe film grown on an Si (001) substrate

Texture of MgO single crystal substrate material

Texture analysis of NiW alloy

Characterization of an InN epitaxial film on a sapphire substrate by X-ray reciprocal space maping (RSM) and rocking curve (RC) analysis

Determination of the layer thickness and roughness of polymer films by X-ray reflectivity