Small angle X-ray scattering of nanomaterials
Figure 1 shows a Small Angle X-ray Scattering (SAXS) profile of a (C3H6)n - α -polypropylene based nanomaterial collected on the Ultima IV. This class of nanomaterials has various applications, including utilization in high strength fibers for lightweight composites and as flame-retardant materials.
The observed profile can be reconstructed as a convolution of the scattering profile from a nanostructural model and the instrument function of the X-ray system (blue curve in Figure 2).
A non-linear least square fit onto the raw data of the calculated profile from the structural model using Rigaku's NANO-Solver software provides information about the size distribution and shape of the particles/pores, as summarized below.
Poly3: |
Cylinder (scale 41.2033) Aspect ration = 5 (fixed) |
7.584 nm/70% fixed 12.543 nm 21.52% |
Diffraction peaks from close packing were observed. Two distributions, large and small cylinders, were needed to reproduce the observed profile by simulation. |
| Cylinder (scale 36.0785) Aspect ration = 5 (fixed) |
1.540 nm/70% fixed 2.584 nm 25.47% |
Tags: SAXS, nanomaterials, Ultima IV