|
High-intensity,
high-resolution measurements of well powdered samples
Traditional powder diffraction measurements use the Bragg-Brentano focusing
geometry to provide high-intensity, high-resolution measurements of well
powdered samples. For many bulk samples with surface irregularities the use of
parallel beam geometry is preferred. The on-demand availability of either
geometry with the Ultima IV, fundamental to CBO,
offers users complete flexibility without the need for reconfiguration.
|
Supported powder diffraction applications include:
|
 |
Accurate quantitative analysis using the Rietveld method is an example of
an advanced X-ray solution made simple by the Ultima IV system. In the
example below, focusing geometry is used to obtain high resolution peak
profiles from a well prepared three phase mixture of ZnO, MgO, and Al2O3.
|
 |
In the case where sample surface quality is poor, one touch selection of
parallel beam geometry, made possible by CBO enables accurate data to be
collected under adverse conditions. In the next example the coarse grains of a
photo-catalyst cause no problems in data acquisition for the Ultima IV
configured with CBO.
|
 |
A seamlessly integrated XYZ positioning stage and magnified CCD camera
system allow X-ray diffraction data to be easily collected from different
points on a sample surface. In the final example the small area measurement
system positioning capability and the intense parallel beam provided by CBO
combine to make measurements from two different locations on a printed circuit
board simple and fast.
|
|
