X-ray diffraction data were collected on a sulfide corrosion sample using Rigaku's Ultima IV multipurpose diffraction system. Phases were identified as shown in Figure 1.
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Figure 1 |
Based on a model structure, calculated from these phases, Rietveld analysis was performed. Figure 2 shows the experimental data (orange), the resultant calculated data (green) and the residual (top blue).
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Figure 2 |
A screen shot from the Jade Whole Pattern Fitting ( WPF ) software module for Rietveld analysis shows the residual parameters of the refinement including R/E (Figure 3).
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Figure 3 |
R/E is a fitting parameter that quantifies the result of the fit, relative to what is theoretically possible. Quantitative results from the analysis are presented in Figure 4.
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Figure 4 |



