Ultima IV application gallery
Click on a title to read an Ultima IV application byte
- Grazing incidence X-ray diffraction of a molybdenum oxide thin film
- X-ray reflectivity analysis of indium tin oxide thin films on glass
- Small angle X-ray scattering analysis of carbon-supported Pt nanoparticles
- Bentonite- A healing clay!
- The composition of eggshell
- Particle size distribution of Pd on silica
- Rietveld refinement of an urban soil
- Rietveld refinement of a sulfide corrosion powder
- XRR studies on a cellulose film
- Unit cell refinement of Montmorillonite clay using the Rietveld method
- Rietveld refinement of the doped lanthanum fluoride (EuLaF3) lattice
- In-plane pole figures on a steel sample
- Grazing incident X-ray diffraction (GIXRD) and X-ray reflectivity (XRR) studies of a Ni-Mn-Ga material
- Detection of low-level polymorphic impurities in pharmaceuticals
- Reitveld refinements from an as-obtained rock chunk
- Measuring trace amorphous components in a raw drug material
- Structural changes of a Whistler alloy due to heat treatment
- Studying molecular arrays in a liquid crystal
- Analysis of glazing chemicals, paints and a vermilion ink in arts and crafts
- Where is chrysotile (asbestos) in serpentine stone?
- Percent crystallinity of a CuO aerogel
- Particle size distribution of Cu nanoparticles in polyimide film
- Size distribution of CdSe nanoparticles
- Fast, nondestructive measurement of polymorphic impurities in medicinal tablets
- Detailed observation of crystal phase transition of fats occurring over a narrow temperature r ange
- The effects of temperature and atmosphere on the aggregation of platinum nanoparticles
- In-situ high temperature studies of a negative thermal expansion coefficient material, ZrW2O8
- Grazing Incidence X-ray Diffraction (GIXRD) analysis of thin film material
- Small area mapping of a fracture on a TiN material
- High-resolution stress and texture measurements
- High-intensity, high-resolution measurements of well powdered samples
- On-demand in-plane scanning for thin film analysis
- Analysis of thin film materials
- In-situ analysis
- Small angle X-ray scattering (SAXS) measurements of nanomaterials
- Small angle X-ray scattering of nanomaterials
- Contact printed Co/insulator/Co molecular junctions
- Rietveld refinement for a cement sample

