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The 5th generation MiniFlex is a general purpose X-ray diffractometer (XRD) that can perform qualitative and quantitative analysis of polycrystalline materials. Read more...
Supermini200 is the world's only high-power benchtop wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U). Read more...
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Elemental analysis products
X-ray fluorescence (XRF) spectrometers
Benchtop tube below sequential WDXRF spectrometer analyzes F through U in solids, liquids and powders
|NEX QC, NEX QC+
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
High power, tube below, sequential WDXRF spectrometer with mapping and superior light element performance
Benchtop WDXRF optimized for sub-ppm detection limits for P, S and Cl in petroleum products
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
|ZSX Primus II
High power, tube above, sequential WDXRF spectrometer with mapping and superior light element performance
ASTM D2622 method WDXRF analyzer for sulfur (S) in petroleum fuels and ULSD
Dedicated ultra-low sulfur analyzer for petroleum
High throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U
Tube below, single element WDXRF analyzer for quality control applications
Large sample capability; high power, tube below, sequential WDXRF spectrometer with mapping
|ZSX Primus III+
High power, tube above, sequential WDXRF spectrometer
X-ray fluorescence technology provides one of the simplest, most accurate and most economic analytical methods for the determination of the elemental composition of most types of materials. The technique is generally non-destructive, requiring little if any sample preparation, and is suitable for solids, liquids, powders and alloys. XRF can measure a wide range of elements, from beryllium (5) to uranium (92), while providing sub-ppm detection limits for many applications.