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XRF

Mini-Z series

X-ray fluorescence technology provides one of the simplest, most accurate and most economic analytical methods for the determination of the chemical composition of many types of materials. It is non-destructive and reliable, requires no, or very little, sample preparation and is suitable for solid, liquid and powdered samples. It can be used for a wide range of elements, from beryllium (4) to uranium (92), and provides detection limits at the ppm level; it can also precisely measure concentrations of up to 100%.

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Mini-Z

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Mini-Z series of benchtop WDXRF analyzers

A Rigaku green solution The Mini-Z series of compact benchtop wavelength dispersive XRF analyzers are designed for analyzing specific elements. Since the optics are optimally configured to a particular element, this series allows for high precision and ease of analysis. The Sulfur analyzer is configured for analysis of S in fuel oil, gasoline, diesel, etc., meets the 15 ppm EPA regulation, and has a LLD (lower limit of detection) of 0.3 ppm.

This instrument can also be configured as a Si analyzer (e.g., for coated Si on paper or plastic), an Al analyzer (e.g., for coated Al on paper or plastic), a Ni analyzer, (e.g., for Ni coating or plating) and a Zr analyzer (e.g., for Zr coating).

Features

Excellent LLD
Peak and background measurements
Easy-to-operate software
No cooling water, plug-n-play
Light weight and compact body
Exceptional repeatability
Wide analysis range
High-resolution, wavelength dispersive optics
No complex sample preparation required (reagent treatment, etc.)

Application notes

Mini-Z Zr for conversion coatings (request a copy)
High performance measurement of zirconium coating thickness on aluminum beverage cans (request a copy)

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