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XSPA-400 ER - X-ray seamless pixel array detector

Summer 2023 Volume 39, No. 2
23-26
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The XSPA-400 ER (XSPA: X-ray Seamless* Pixel Array, ER: Energy Resolution) is a next-generation 2D semiconductor detector with a higher energy resolution than conventional models. With this higher energy resolution, the XSPA-400 ER reduces X-ray fluorescence, which can be a significant source of background intensity for powder diffraction patterns on samples containing transition metal elements. In addition to 0D and 1D measurements, 2D measurements are also available. The 2D mode allows the user to observe Debye-Scherrer rings, which provide information about sample orientation and the existence of coarse particles. Furthermore, the 75 μm× 75 μm pixel size provides high spatial resolution. These features contribute to improved accuracy in quantitative analysis of trace crystalline phases, precise analysis of lattice constants, and 2D stress analysis of samples such as steel and battery materials that contain transition metal elements.

*Seamless Pixel Detectors: Typical hybrid pixel detectors use a tiled array of readout ASICs (Application Specific Integrated Circuits). With these tiled array detectors the pixel shapes at the IC boundary differ from those in other areas on the IC, requiring correction of the IC boundary. In addition, the correction sometimes remains incomplete depending on the measurement conditions, leaving an intensity difference between the boundary and other non-boundary areas on the IC. As a better solution, the seamless pixel detector has the same pixel shape over the whole IC, eliminating the need for IC boundary correction and thus producing a uniform image.

 

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