台式X射线衍射(XRD)仪

多晶材料的定性分析与定量分析

MiniFlex

2012年最新添加了MiniFlex系列的台式X射线衍射(XRD)分析仪。第5代MiniFlex可以进行多晶材料的定性分析与定量分析,是一般用途的X射线分衍射仪。本次MiniFlex提供两种类型以供选择,当运行600W(X射线管)时,MiniFlex600的能量比其他台式模型高两倍,实现了更为快捷的分析并且改善了总体的容许功率。运行300W(X射线管)时,新型MiniFlex300不需要外部的送水装置。每个模式都设计使台式组件的灵活性最大化。

为了适应当今XRD分析的快速节奏,第5代MiniFlex通过技术创新增强了其速度与敏感度。例如D/teX高速检测器(选购)外加新型600WX射线源。石墨单色器(选购)外加标准闪烁计数器,通过优化衍射峰和背景的比率使敏感度最大化。当最注重分辨率时,可以通过选择入射狭缝和接收狭缝从而提供想要得到的分辨率。对于具有高样品容许功率的仪器来说,MiniFlex是唯一带有样品转换器的台式XRD系统。无论是在大学或学院中进行X射线衍射教学,还是例行工业质量保证,MiniFlex提供了其性能和价值。

每台MiniFlex仪器都会标准配有最新版本的PDXL。PDXL是理学公司推出的X射线粉末衍射综合分析软件。最新版本的PDXL提供重要的新功能:包括通过基本参数法(FP)更精确的计算峰值,利用晶体学开放数据库(COD)和晶体结构分析向导进行物相分析。

1973年推出的原始的MiniFlex的设计允许初学者通过使用简洁的XRD仪器,分析得到与经验丰富的专家相同的测试结果。新型MiniFlex在这些使它流行多年的特点的基础上做了进一步改善:包括外观小巧、设计稳固,可以在很小的空间内通过简单的操作进行安装,以及成本低廉。

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概要:

  • 2012年推出的第5代新型设计
  • 简洁的安全保障防辐射罩
  • 可变入射狭缝
  • 安装简单和用户培训
  • 测角仪调节完毕(用户无需调节)
  • 便携式计算机操作
测试:
  • 物相分析
  • 定量分析
  • 结晶度(%)
  • 晶粒尺寸与晶格畸变
  • 晶格参数精修
  • 里特沃尔德分析
  • 分子结构
选购产品:
  • 6位样品转换器
  • 石墨单色器
  • 高速一维检测器D/teX Ultra
  • 气体分离器(气密样品台)

MiniFlex accessories

AccessoryASC-8 : automatic 8 position sample changer with spinner
Automatic 8-position sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. Fully automatic alignment. Programmable.
 
AccessorySample holders
Various sample holder are available to meet the specific needs of particular applications.
 
AccessorySpecimen rotation attachment
The sample rotation stage allows continuous rotation at variable
speed of the sample holder to improve particle statistics during
powder diffraction measurements.
 
AccessoryGraphite monochromator for D/teX Ultra
The graphite monochromator optimizes sensitivity by lowering the background level. It improves signal-to-noise by eliminating fluorescence from Mn, Fe, Co, and Ni containing materials.
 
AccessoryAir-sensitive sample holder
An enclosed sample holder is available for users studying materials that might degrade in the presence of oxygen.
 
AccessoryD/teX Ultra high speed detector
This 1D silicon strip detector is optionally available for fast, high-resolution scanning.
 
AccessoryBTS 500 high temperature attachment
The high temperature attachment can heat a sample to do in-situ powder diffraction measurements under high temperature conditions from ambient to 500°C.
 
AccessoryHyPix-400 MF: 2D HPAD detector
Advanced hybrid array pixel detector (HPAD) with zero background noise, an active area of ​​400 mm2, spatial resolution of 100 μm, and maximum count rate of 106 cps/pixel or more. HyPix-400 can operate in 0D, 1D or 2D modes.

SmartLab Studio II is a new Windows®-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components. Just one click switches from measurement to analysis. Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop by selecting an appropriate layout. The software provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc.

Powder XRD: phase identification with a variety of available databases

Peak position, FWHM, integrated intensity and crystallite size are calculated by profile fitting. Rigaku’s optional “Hybrid Search/Match” uses peak-base qualification, which detects heavily distorted lattices, to identify solid solution phases that are difficult to identify. It also can determine whether preferred orientation exists based on decomposed peak intensities.

Powder XRD: quantification package

This option supports internal standard, external standard, and standard addition calibration methods. Calibration curves are used to quantify specific phases in the sample.

Powder XRD: comprehensive analysis package

This optional package can provide analysis results such as crystalline size, lattice strain, lattice parameters refinement, % crystallinity based on fully automated profile fitting executed after loading measured data. Results obtained aid in understanding the relationship between structure and physical properties, and allow users to compare results across different samples.

Powder XRD: direct derivation analysis package

The direct derivation (DD) method was invented by Professor Hideo Toraya of Rigaku Corporation in 2016. It quantifies phases from all integrated diffraction intensities and the chemical formulas of each phase found. Compared to the classical RIR method, where a single integrated peak intensity and RIR number are used, the DD method is less affected by preferred orientation and peak overlap.

Powder XRD: Rietveld analysis package

The package performs phase identification followed by Whole Powder Pattern Fitting (WPPF). The Rietveld analysis refines crystal structure or quantifies the phases directly from measured data, requiring neither reference samples nor a calibration curve. The whole powder pattern decomposition (Pawley method) is based on both the measured peak positions, and peaks shapes.



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