波长色散X射线荧光光谱仪

快速定量元素分析的高性能WDXRF

ZSX Primus

理学公司的ZSX Primus提供从Be到U主、次元素快速定量分析,广泛的样品种类,很少的标样要求。

强度高、灵活性大且元素分析可靠

ZSX Primus是理学公司ZSX系列中最新的仪器。继续通过及时和无缝的方式提供准确的结果,具有无与伦比的可靠性、灵活性和易用性。满足当今实验室中的任何挑战。

低原子序数性能、Mapping分析和多点分析

对分析复杂样品提供卓越的性能和灵活性,ZSX Primus中具有一个30μm的X射线管(工业中最薄端窗的X射线管),用于特殊轻元素(低原子序数)检出限。结合了最先进的Mapping分析包来检测均质性和夹杂物,ZSX Primus简单地提供了其他分析方法无法提供的详细样品分析。可用多点分析帮助消除非均质材料的抽样误差。

SQX基本参数软件和EZ扫描软件

EZ扫描允许用户在没有事先设定任何条件的情况下分析未知样品。此节省时间的功能仅要求单击几次鼠标和输入样品名称。结合SQX基本参数软件,可以提供最准确、最快速的XRF的结果。SQX可以自动修复包括重叠的全部矩阵效果。SQX还可以通过光电子(轻元素和超轻元素)、变化的气体环境、杂质和不同的样品尺寸,校正二次激发的效应。使用匹配库和完美的扫描分析程序提高了准确性。

ZSX Primus
Ask for more info

Features

  • 广泛的元素分析范围Be~U
  • 占地面积小,节省实验室空间
  • 500μm微观分析
  • 下照射式设计适合液体和松散粉末要样品
  • 30μm的X射线管提供卓越的超轻元素性能
  • 用于元素分布的Mapping分析
  • 氦气密封是指样品室始终在真空的条件下

ZSX Primus specifications

General

Elemental coverage
₄Be through ₉₂U

Optics
Wavelength dispersive, sequential, tube below
X-ray generator

X-ray tube
End window, Rh-anode, 3kW or 4 kW, 60kV

HV power supply
High frequency inverter, ultra-high stability

Cooling
Internal water-to-water heat exchanger
Spectrometer

Sample changer
48 positions standard, 104 SSLS optional

Sample inlet
Air lock system

Maximum sample size
51 mm (diameter) by 30 mm (high)

Sample rotation speed
30 rpm

Primary X-ray filters
Al25, Al125, Ni40, Ni400 and Be (optional, for window protection)

Beam collimators
6 auto-selectable diameters: 35, 30, 20, 10, 1 and 0.5 mm
27 mm can be selected instead of 30 mm for SSLS

Divergence slit
3 auto-selectable: standard, high, and coarse (optional) resolutions

Receiving slit
For SC and for F-PC detectors

Goniometer
θ – 2θ independent drive mechanism

Angular range
SC: 5-118°, F-PC: 13-148°

Angular reproducibility
Ultra-high precision

Continuous scan
0.1 - 240°/min

Crystal changer
10 crystals, automatic mechanism

Vacuum system
2 pump high-speed system w/ (optional) powder trap

He flush system
Optional, with partition
Detector systems

Heavy element detector
Scintillation counter (SC)

Light element detector
Flow proportional counter (F-PC)

Attenuator
In-out automatic exchanger (1/10)

Smart Sample Loading System

Rigaku’s new Smart Sample Loading System (SSLS) adds a new dimension of flexibility to the ZSX Primus WDXRF spectrometer. For sample types that are amenable to such a process, a vacuum chuck can be used to load samples into pre-loaded sample holders. This sample loading system has two important consequences: time is saved by the operator since they are no longer required to manually load each sample in a sample cup and the number of samples that can be held on the sample deck is increased significantly

Permissible sample types

Rigaku’s SSLS can handle samples up to 50 grams in weight and the modular sample deck racks have been designed for different sample diameters. Samples with a diameter of 35 mm can be stored 32 samples to a rack with three such racks sitting on the deck. Samples with a diameter of 40 mm can be stored 24 samples to a rack with a possibility of three of these racks on the deck. In addition, the racks can be mixed so that different sample sizes are easily accommodated on the deck at the same time. Sample types that are amenable to this type of loading procedure include fused glass beads and pressed powders. Both plastic and metal pressed powder holders are permitted.

Sample handling

A precision vacuum chuck is used to safely and reproducibly pick up the samples and place them in the measurement sample holder. Each sample type has a specific sizing ring positioned in the measurement sample holders to assure that the sample is properly positioned for measurement, and the analytical reading surface is never compromised.

Sample tracking

Keeping track of samples has never been easier. A two-dimensional barcode can be attached to the non-analysis surface of each sample. Before the sample is lowered into the pre-evacuation chamber through the input port, the barcode is scanned and the sample information is loaded into the control software.

Request brochure

Smart Sample Loading System
If you are unable to view this video, click here to download it (23 MB).
If you are unable to view this video, click here to download it (31 MB).

Features

  • Increasesthe number of samples on deck
    • The maximum number of samples that can be loaded in the same installation space as compared to the conventional sample changer has been increased from 48 to 104 units (when ∅35mm sample trays are used)
  • Flexible combination of sample trays
    • It is possible to combine various sample trays (the sample trays for the standard sample holder, for ∅35mm sample size and ∅40mm sample size) in various combinations with a simple software operation for deck configuration.
  • Automated analysis interface provided
    • By communicating with the automated analytical system control computer, the sample set at the sample transfer position is measured automatically.
  • Significantly reduces labor requirements and improves accuracy
    • With integrated barcode reader (option), labor requirements are reduced and data transcription accuracy increased.
If you are unable to view this video, click here to download it (315 MB).

ZSX Primus overview

  • Qualitative analysis:
    • Automatic peak identification
    • Smoothing, background subtraction
  • Quantitative analysis:
    • Matrix correction: Lachance-Traill, DeJohngh, JIS, etc.
    • Linear, quadratic and cubic regression, multiple line
    • Fundamental parameter method
  • EZ scan (qualitative)
  • Application template
  • Analysis area automatic selection (mask size detection)
  • Peak deconvolution (function and standard profile)
  • Background fitting (multi-point function fitting, area designation)
  • Fixed precision analysis
  • Help function
  • E-mail forwarding function
  • Universal standard sample
  • Analysis simulation program (analysis depth evaluation, etc.)

Optional:

  • SQX program:
    • EZ scan (SQX)
    • Fixed angle measurement
    • Thin-film analysis
    • Theoretical overlap correction
    • Drift correction library
    • Photoelectron FP method
    • He atmosphere correction
    • Sample film correction:
      • Impurity correction
      • Matching library
      • SQX scatter FP method
      • Material judgment
  • Quantitative scatter FP method
  • Quantitative FP theoretical overlap correction
  • Fusion disk correction (flux evaporation)
  • Charge correction
  • Program operation:
    • Time preset analysis
    • Energy saving
    • Auto power off
  • Sample observation mechanism
  • Point/mapping function
  • Remote control function (VCP)