上照射式波长色散X射线荧光光谱仪

快速定量元素分析的高性能WDXRF

ZSX Primus II

理学公司的ZSX PrimusⅡ提供从Be到U主、次元素快速定量分析,广泛的样品种类,很少的标样要求。

上照射式的光学的高度可靠性

ZSX PrimusⅡ具有创新性的上照射式的光学配置。再也不用担心由于光束路径受污染或故障时间而导致样品室的维护。上照射式的光学配置消除了清洁的烦扰并增加了正常运行时间。

低原子序数性能、Mapping分析和多点分析

对分析复杂样品提供卓越的性能和灵活性,ZSX PrimusⅡ中具有一个30μm的X射线管(工业中最薄端窗的X射线管),用于特殊轻元素(低原子序数)检出限。结合了最先进的Mapping分析包来检测均质性和夹杂物,ZSX PrimusⅡ简单地提供了其他分析方法无法提供的详细样品分析。可用多点分析帮助消除非均质材料的抽样误差。

SQX基本参数软件和EZ扫描软件

EZ扫描允许用户在没有事先设定任何条件的情况下分析未知样品。此节省时间的功能仅要求单击几次鼠标和输入样品名称。结合SQX基本参数软件,可以提供最准确、最快速的XRF的结果。SQX可以自动修复包括重叠的全部矩阵效果。SQX还可以通过光电子(轻元素和超轻元素)、变化的气体环境、杂质和不同的样品尺寸,校正二次激发的效应。使用匹配库和完美的扫描分析程序提高了准确性。

ZSX Primus II
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Features

  • 广泛的元素分析范围Be~U
  • 上照射式的光学配置最大限度的减小了污染问题
  • 占地面积小,节省实验室空间
  • 500μm微观分析
  • 30μm的X射线管提供卓越的超轻元素性能
  • 用于元素分布的Mapping分析
  • 氦气密封是指样品室始终在真空的条件下

ZSX Primus II specifications

General
  Elemental coverage ₄Be through ₉₂U
  Optics Wavelength dispersive, sequential, tube above
X-ray generator
  X-ray tube End window, Rh-anode, 3kW or 4 kW, 60kV
  HV power supply High frequency inverter, ultra-high stability
  Cooling Internal water-to-water heat exchanger
Spectrometer
  Sample changer 48 positions standard, 96 optional
  Sample inlet APC automatic pressure controller
  Maximum sample size 51 mm (diameter) by 30 mm (high)
  Sample rotation speed 30 rpm
  Primary X-ray filters Al25, Al125, Ni40 and Ni400
  Beam collimators 6 auto-selectable diameters: 35, 30, 20, 10, 1 and 0.5 mm
  Divergence slit 3 auto-selectable: standard, high, and coarse (optional) resolutions
  Receiving slit For SC and for F-PC detectors
  Goniometer θ – 2θ independent drive mechanism
  Angular range SC: 5-118°, F-PC: 13-148°
  Angular reproducibility Ultra-high precision
  Continuous scan 0.1 - 240°/min
  Crystal changer 10 crystals, automatic mechanism
  Vacuum system 2 pump high-speed system w/ (optional) powder trap
  He flush system Optional, with partition
Detector systems
  Heavy element detector Scintillation counter (SC)
  Light element detector Flow proportional counter (F-PC)
  Attenuator In-out automatic exchanger (1/10)
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ZSX Primus II software

Overview:

  • Qualitative analysis:
    • Automatic peak identification
    • Smoothing, background subtraction
  • Quantitative analysis:
    • Matrix correction: Lachance-Traill, DeJohngh, JIS, etc.
    • Linear, quadratic and cubic regression, multiple line
    • Fundamental parameter method
  • EZ scan (qualitative)
  • Application template
  • Analysis area automatic selection (mask size detection)
  • Peak deconvolution (function and standard profile)
  • Background fitting (multi-point function fitting, area designation)
  • Fixed precision analysis
  • Help function
  • E-mail forwarding function
  • Universal standard sample
  • Analysis simulation program (analysis depth evaluation, etc.)

Optional:

  • SQX program
    • EZ scan (SQX)
    • Fixed angle measurement
    • Thin-film analysis
    • Theoretical overlap correction
    • Drift correction library
    • Photoelectron FP method
    • He atmosphere correction
    • Sample film correction
      • Impurity correction
      • Matching library
      • SQX scatter FP method
      • Material judgment
  • Quantitative scatter FP method
  • Quantitative FP theoretical overlap correction
  • Fusion disk correction (flux evaporation)
  • Charge correction
  • Program operation
    • Time preset analysis
    • Energy saving
    • Auto power off
  • Sample observation mechanism
  • Point/mapping function
  • Remote control function (VCP)