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    ZSX Primus III NEXT

    Tube-Above Sequential Wavelength Dispersive X-ray Fluorescence Spectrometer for Industrial Applications

    Elemental analysis of solid samples

    Rigaku ZSX Primus III NEXT delivers rapid elemental industrial quality control by quantitative determination of major and minor elements from Be through Cm for powder and solid samples.

    This new scanning wavelength dispersive X-ray fluorescence spectrometer features Rigaku’s unique X-ray tube-above configuration and is built upon the succesful ZSX Primus series platform.

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    ZSX Primus III NEXT Overview

    Geared for industrial applications

    The ZSX Primus III NEXT is an ideal tool for any industrial application, requiring elemental analysis, such as

     ∘ Minerals and Mining
     ∘ Metals
     ∘ Cement
     ∘ Ceramics and Refractories
     ∘ Glass Manufacturing
     ∘ Petrochemicals
     ∘ Chemicals
     ∘ Environment

    Turnkey application packages

    Industry-specific application packages are available. The "Pre-Calibration Package," which stores calibration curves at the time of shipment, the "Calibration Package," which includes standard samples and analysis conditions, and the "Master Matching Library" for standardless analysis (SQX) which is specialized for certain types of products, are available to help users start up the analysis operations.

    Easy application sharing

    The ZSX Primus III NEXT, ZSX Primus IV, and ZSX Primus IVi share the same hardware and software platform, making it easy to share applications between spectrometers.

    Improved quality of analytical results

    Have confidence in each analysis result. Measurement statistics and spectrometer physical parameters can be displayed with each analysis result to easily spot irregularities.

    ZSX Primus III NEXT—your ideal partner for fast and reliable production control in highly demanding industrial environments.

    ZSX Primus III NEXT Features

    High-end WDXRF spectrometer for industrial environments
    State-of-the-art industrial spectrometer for more harsh operating conditions
    Increased reliability due to tube-above configuration
    Less risk of spectrometer contamination, thereby increasing uptime
    Extended analytical flexibility
    ₄Be to ₉₆CM - Full analysis capabilities
    ZSX Guidance software
    No need to be a specialist. Integrated intelligence assists with calibration development
    High-speed analysis
    Precise and accurate results in minutes allows real-time process control
    Attractive pricing
    All this for a more than affordable price
    Improved service and application support
    Rigaku is a trusted partner
    Data sharing
    Makes it possible to have the Rigaku spectrometers in all your laboratories operating on the same calibrations

    ZSX Primus III NEXT Specifications

    Analytical range ₈O - ₉₆Cm standard (₄Be - ₉₆Cm Optional - depending on crystal configurations)
    Spectral method Wavelength dispersive X-ray fluorescence
    Atmosphere Vacuum
    X-ray tube End window type Rh target 3 kW
    Irradiation method Tube-above
    Sample changer Expandable sample changer with up to 48 positions
    Sample inlet Air lock system
    Maximum sample size φ 52 mm × 30 mm (H)
    Primary filter Ni400, Ni40, Al125, Al25
    Primary Soller slit 3 positions automatic exchange machanism
    Standard and fine slits
    Optional: Ultralight element slit
    Analyzing crystal Standard: LiF, 200, PET, RX26
    Pulse height analyzer Digital multichannel analyzer (DMCA)
    Detector SC (Scintillation counter)
    F-PC (Gas flow proportional counter)
    Optional: S-PC LE (Gas sealed proportional counter:
    does not require P-10 gas)
    Power requirements Instrument: Single (200 - 240 V), three phase (200 V) 50/60 Hz 40A
    Personal computer: 1-phase, 100-240 V, 10A

    ZSX Primus III NEXT Application Notes

    The following application notes are relevant to this product

    ZSX Primus III NEXT Resources

    Webinars

    Analysis of Hazardous Heavy Elements in Soil and Sediment Watch the Recording
    A Non-Destructive XRF Technique for Rapid and Easy Screening of Residual Catalysts in APIs and Intermediates Watch the Recording
    Quality control of API potency, excipient blend uniformity, and heavy metals impurities by non-destructive and direct analysis of intact pills by XRF Watch the Recording

    Rigaku Journal articles

    adobeWavelength Dispersive X-ray fluorescence Spectrometer - ZSX Primus III NEXT Read the Article
    adobeHow to measure trace amounts of sample by X-ray fluorescence analysis Read the Article
    adobeThickness and composition analysis of thin film samples using FP method by XRF analysis Read the Article
    adobeSample preparation for X-ray fluorescence analysis V. /　Fusion bead method—part 2: practical applications Read the Article
    adobeSample preparation for X-ray fluorescence analysis IV./ Fusion bead method―part 1 basic principals Read the Article
    adobeSequential benchtop WDXRF spectrometer Supermini200 Read the Article

    ZSX Primus III NEXT Events

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