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WE'RE GOING TO SPACE
The VZLUSAT-2 satellite equipped with Rigaku optics will be launched soon
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A fast and agile system for small molecule 3D structure analysis
XtaLAB Synergy-S
A fast and agile system for small molecule 3D structure analysis
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Rising to the Challenge. Together.
RISING TO THE CHALLENGE. TOGETHER.
Rigaku supports all those who are fighting COVID-19 around the world.
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X-ray Imaging Webinar
X-RAY IMAGING WEBINAR
Life sciences applications utilising the X-ray computed tomography technique
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An Intelligent X-ray Diffractometer
AN INTELLIGENT X-RAY DIFFRACTOMETER
The XtaLAB Synergy Flow with Intelligent Automated Workflow for single crystals
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THE BRIDGE
Rigaku's monthly Materials Analysis eNewsletter
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XRF Data Presentation
XRF DATA PRESENTATION
Live Virtual Workshop: Fourth PQRI Workshop on ICH Q3D Elemental Impurities Requirements
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TOPIQ: Quick Webinars
TOPIQ: WEBINARS
During the Covid-19 pandemic, keep up to date through Rigaku’s webinar series.
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THE RIGAKU ADVANTAGE

nano3DX

: Ultra-high resolution nano-tomography using parallel beam geometry

XtaLAB Synergy-DW

: High-flux dual-wavelength diffractometer for multi­­­purpose diffraction

ResQ CQL

: Offers advanced identifi­­­cation of potential threats in an improved tactical form factor

NEX DE VS

: High-performance small (variable) spot benchtop EDXRF elemental analyzer

FEATURED SOLUTIONS

CEMENT

CEMENT

X-ray analytical techniques, employed across the cement industry, are used to determine metal-oxide concentrations and free lime.
 
 

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POLYMERS & PLASTICS

POLYMERS & PLASTICS

For all tasks in polymer research, product development, and production quality control, X-ray techniques are core analytical tools.
 
 

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MINING & REFINING 2

MINING & REFINING

XRF and XRD are key techniques for characterizing the elemental and phase composition of geological materials from mining to metals.
 

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PHARMACEUTICALS

PHARMACEUTICALS

Single crystal and powder X-ray diffraction are extensively used in the drug discovery, design, development and formulation processes.
 
 

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PHOTOVOLTAICS

PHOTOVOLTAICS

X-ray techniques are typically used to measure the characteristics (thickness to molecular structure) of thin-film layers for R&D to production.
 

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NANOPARTICLES

NANOPARTICLES

Physical and chemical properties of nanoparticles and nanocrystalline materials are strongly influenced by their particle size and shape.
 

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GEOLOGY & MINERALS

GEOLOGY & MINERALS

X-ray fluorescence and X-ray diffraction are key techniques for characterizing the element and phase composition of geological materials.
 
 

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EDUCATION

EDUCATION

Our lines of benchtop products were designed to allow our X-ray techniques to become a routine laboratory methods and teaching tools.
 
 

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PROCESS CONTROL

PROCESS CONTROL

Analytical information, such as elemental analysis and chemical composition, provides critical data for statistical process control.
 
 

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PETROLEUM

PETROLEUM

XRD and XRF instrumentation for materials characterization at every stage of the exploration, production and distribution process.
 
 

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SEMICONDUCTORS

SEMICONDUCTORS

Rigaku is a pioneer and leader in designing and manufacturing X-ray based measurement tools for semiconductor manufacturing.
 
 

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CRYSTALLOGRAPHY

CRYSTALLOGRAPHY

This technique employs single crystal X-ray diffraction (SXRD) to unambiguously determine the three dimensional structure of molecules.
 
 

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MATERIALS SCIENCE

MATERIALS SCIENCE

X-ray diffraction (XRD) is a primary technique for the study of advanced materials at the atomic and molecular level.
 
 

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LEARN MORE ABOUT RIGAKU

 

Application
notes

Rigaku has hundreds of proven solutions for all of your analytical needs.

Application Notes

 

 

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Gallery

Learn about Rigaku and our products without having to read anything.
 

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Events &
Training

Want to talk face to face? Come visit us at a trade-show or conference.
 

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Rigaku
Journal

Since 1984, the Rigaku Journal has delivered cutting edge X-ray based science.

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JOIN US

Learn more about our products at these events

(See more )
AAPS PharmSci 360 2020 - Virtual Event Website
GSA 2020 - Online event Website
PhysChem Forum Japan
Japanese Association Forensic Science Conference Japan
MS&T 2020 - Virtual Event Website

RECENT PRESS RELEASES

RIGAKU JOURNAL ARTICLES

Because...
Science Matters!
 

Winter 2013, Volume 29, No. 1

Technical article
Kazuhiko Omo
Crystal defects in SiC wafers and a new X-ray topography system

Winter 2011, Volume 27, No. 1

Technical article
Aya Ogi and Katsuhiko Inaba
X-ray thin-film measurement techniques VI. Small Angle X-ray Scattering

Winter 2014 Volume 30, No. 1

Technical article
Katsuhiko Inaba
General features of GaN-related materials
 
Journal Library

OUR LOCATIONS

Rigaku Divisions
 
Rigaku Divisions