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nano3DX

: Ultra-high resolution nano-tomography using parallel beam geometry

XtaLAB Synergy-DW

: High-flux dual-wavelength diffractometer for multipurpose diffraction

ResQ CQL

: Offers advanced identification of potential threats in an improved tactical form factor

NEX DE VS

: High-performance small (variable) spot benchtop EDXRF elemental analyzer

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Rigaku's monthly
Materials Analysis eNewsletter

By handheld laser-induced breakdown spectroscopy (LIBS)

Metal Alloy Identification

By handheld laser-induced
breakdown spectroscopy (LIBS)

Providing instrumentation in support of modern materials research

Materials Characterization

Providing instrumentation in support
of modern materials research

The original 1064 nm Raman for chemical identification--redefined

ResQ CQL

The original 1064 nm Raman for chemical
identification—redefined

Elemental analysis of solids, liquids, powders, alloys and thin films

Supermini200

Elemental analysis of solids, liquids
powders, alloys and thin films

Helping structural biologists and chemists determine 3D structures of molecules

Molecular Structure

Helping structural biologists and chemists
determine 3D structures of molecules

Providing instrumentation in support of modern materials research

Materials Characterization

Providing instrumentation in support
of modern materials research

Qualitative and quantitative analysis of polycrystalline materials

MiniFlex

Qualitative and quantitative analysis
of polycrystalline materials

$Powder and thin film diffraction, SAXS and in-plane scattering with Guidance software$

SmartLab®

Powder and thin film diffraction, SAXS and in-plane
scattering with Guidance software

Elemental Analysis

Elemental Analysis

Providing analytical instrumentation for one of
the most critical measurements in industry

Helping the semiconductor industry achieve tomorrow's technology roadmap

Semiconductor Metrology

Helping the semiconductor industry achieve
tomorrow's technology roadmap

High-performance WDXRF for rapid quantitative elemental analysis

ZSX Primus IV

High-performance WDXRF for rapid quantitative
elemental analysis

Elemental Analysis

Elemental Analysis

Providing analytical instrumentation for one of
the most critical measurements in industry

For on-the-spot identification of the most difficult alloy grades

KT Series Analyzer

For on-the-spot identification of
the most difficult alloy grades

A fast and agile system for small molecule 3D structure analysis

XtaLAB Synergy-S

A fast and agile system for small
molecule 3D structure analysis

Thickness, density, roughness and composition of films on blanket and patterned wafers

MFM310

Thickness, density, roughness and composition
of films on blanket and patterned wafers

First responders can confidently identify a suspicious substance

Chemical Identification

First responders can confidently
identify a suspicious substance

Application
notes

Rigaku has hundreds of proven solutions for all of your analytical needs.

Application Notes

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Journal

Since 1984, the Rigaku Journal has delivered cutting edge X-ray based science.

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Learn more about our products at these events

What to do when the lights go out - rethinking the homelab for structural biology research	March 31, 2020	Webinar	Register Now!
X-ray Microscopy Seminar and Workshop - POSTPONED	April 1, 2020	Newark, DE	Website
TOPIQ \| PROCESSING A PX DATA SET WITH CRYSALISᴾʳᵒ	April 3, 2020	Webinar	Register Now!
TOPIQ \| Quantitative phase analysis based on Rietveld method for data collected on MiniFlex600	April 7, 2020	Webinar	Register Now!
CrysAlisᴾʳᵒ 40: 64-bit, Synergy, HyPix-Arc 150°, AutoChem4.0, Ewald 3D	April 9, 2020	Webinar	Register Now!

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