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nano3DX

: Ultra-high resolution nano-tomography using parallel beam geometry

XtaLAB Synergy-DW

: High-flux dual-wavelength diffractometer for multipurpose diffraction

ResQ CQL

: Offers advanced identification of potential threats in an improved tactical form factor

NEX DE VS

: High-performance small (variable) spot benchtop EDXRF elemental analyzer

Providing instrumentation in support of modern materials research

Materials Characterization

Providing instrumentation in support
of modern materials research

$Powder and thin film diffraction, SAXS and in-plane scattering with Guidance software$

SmartLab®

Powder and thin film diffraction, SAXS and in-plane
scattering with Guidance software

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Rigaku's monthly
Materials Analysis eNewsletter

Elemental Analysis

Elemental Analysis

Providing analytical instrumentation for one of
the most critical measurements in industry

Elemental analysis of solids, liquids, powders, alloys and thin films

Supermini200

Elemental analysis of solids, liquids
powders, alloys and thin films

By handheld laser-induced breakdown spectroscopy (LIBS)

Metal Alloy Identification

By handheld laser-induced
breakdown spectroscopy (LIBS)

For on-the-spot identification of the most difficult alloy grades

KT Series Analyzer

For on-the-spot identification of
the most difficult alloy grades

First responders can confidently identify a suspicious substance

Chemical Identification

First responders can confidently
identify a suspicious substance

The original 1064 nm Raman for chemical identification--redefined

ResQ CQL

The original 1064 nm Raman for chemical
identification—redefined

Helping structural biologists and chemists determine 3D structures of molecules

Molecular Structure

Helping structural biologists and chemists
determine 3D structures of molecules

A fast and agile system for small molecule 3D structure analysis

XtaLAB Synergy-S

A fast and agile system for small
molecule 3D structure analysis

Helping the semiconductor industry achieve tomorrow's technology roadmap

Semiconductor Metrology

Helping the semiconductor industry achieve
tomorrow's technology roadmap

Thickness, density, roughness and composition of films on blanket and patterned wafers

MFM310

Thickness, density, roughness and composition
of films on blanket and patterned wafers

Providing instrumentation in support of modern materials research

Materials Characterization

Providing instrumentation in support
of modern materials research

Qualitative and quantitative analysis of polycrystalline materials

MiniFlex

Qualitative and quantitative analysis
of polycrystalline materials

Elemental Analysis

Elemental Analysis

Providing analytical instrumentation for one of
the most critical measurements in industry

High-performance WDXRF for rapid quantitative elemental analysis

ZSX Primus IV

High-performance WDXRF for rapid quantitative
elemental analysis

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notes

Rigaku has hundreds of proven solutions for all of your analytical needs.

Application Notes

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Journal

Since 1984, the Rigaku Journal has delivered cutting edge X-ray based science.

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Learn more about our products at these events

General Police Equipment Exhibition & Conference (GPEC) 2020	February 18, 2020 - February 20, 2020	Frankfurt, Germany	Website
Texas Society for Microscopy	February 20, 2020 - February 22, 2020	College Station, TX	Website
SPIE Advanced Lithography	February 23, 2020 - February 26, 2020	San Jose, CA	Website
USBTA EOD Industry Day	February 26, 2020	Washington, DC	Website
AWA Global Release Liner	February 27, 2020 - February 28, 2020	Amsterdam, Netherlands	Website

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