High speed RSM of a III-nitride epitaxial film by 1D detection mode AppNote XRD2024: High speed RSM of a III-nitride epitaxial film by 1D detection mode
Phase identification of an organic thin film by GI-WAXS measurement with a 2D detector AppNote B-XRD2023: Phase identification of an organic thin film by GI-WAXS measurement with a 2D detector
Analysis of uniaxially oriented film by wide-range RSM AppNote B-XRD2025: Analysis of uniaxially oriented film by wide-range RSM
Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM AppNote B-XRD2026: Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM
Evaluation of barium titanate polymorphs by Rietveld analysis AppNote XRD1149: Evaluation of barium titanate polymorphs by Rietveld analysis
Evaluation of crystal quality (tilt and twist widths) of group-III nitride film by the rocking curve method AppNote B-XRD2001: Evaluation of crystal quality (tilt and twist widths) of group-III nitride film by the rocking curve method
Crystal orientation evaluation of epitaxial film and ultra-thin buffer layers by in-plane reciprocal space mapping AppNote B-XRD2006: Crystal orientation evaluation of epitaxial film and ultra-thin buffer layers by in-plane reciprocal space mapping