High speed RSM of a III-nitride epitaxial film by 1D detection mode AppNote XRD2024: High speed RSM of a III-nitride epitaxial film by 1D detection mode
Thickness and composition of ITO thin film by FP method AppNote XRF1063: thickness/composition of ITO thin film by FP method
Phase identification of an organic thin film by GI-WAXS measurement with a 2D detector AppNote B-XRD2023: Phase identification of an organic thin film by GI-WAXS measurement with a 2D detector
Analysis of uniaxially oriented film by wide-range RSM AppNote B-XRD2025: Analysis of uniaxially oriented film by wide-range RSM
Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM AppNote B-XRD2026: Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM
Evaluation of residual stress of thin films by GI-XRD and the multiple hkl method AppNote B-XRD3005: Evaluation of residual stress of thin films by GI-XRD and the multiple hkl method