Evaluation of residual stress of thin films by GI-XRD and the multiple hkl method AppNote B-XRD3005: Evaluation of residual stress of thin films by GI-XRD and the multiple hkl method
Calculation of molecular stacking spacing of copper phthalocyanine using PDF analysis AppNote XRD1139: Calculation of molecular stacking spacing of copper phthalocyanine using PDF analysis
Calculation of molecular stacking spacing of copper phthalocyanine using PDF analysis AppNote XRD1139: 通过PDF 分析计算酞菁铜的分子层积间隔
Evaluation of crystal quality (tilt and twist widths) of group-III nitride film by the rocking curve method AppNote B-XRD2001: Evaluation of crystal quality (tilt and twist widths) of group-III nitride film by the rocking curve method
Crystal orientation evaluation of epitaxial film and ultra-thin buffer layers by in-plane reciprocal space mapping AppNote B-XRD2006: Crystal orientation evaluation of epitaxial film and ultra-thin buffer layers by in-plane reciprocal space mapping
High speed RSM of a III-nitride epitaxial film by 1D detection mode AppNote XRD2024: High speed RSM of a III-nitride epitaxial film by 1D detection mode