Advanced semiquant analysis by 'SQX Scatter FP' method AppNote XRF1036: semiquant analysis by 'SQX Scatter FP' method
Fused bead analysis for various oxide materials AppNote XRF1048: fused bead analysis for various oxide materials
Visualization and size analysis of foreign matter in CFRP using high-resolution 3D X-ray microscope AppNote XRI1004: Visualization and size analysis of foreign matter in CFRP using high-resolution 3D X-ray microscope