Background

In the past, quantitative analysis with X-ray diffractometry was performed using calibration curves, but due to the progress of computers and analysis software, quantitative analysis using the WPPF (Whole Powder Pattern Fitting) method has now come into wide use. In the WPPF method, profile fitting is performed over a comparatively broad angular range, based on information involving the crystal system and lattice constants. Since diffraction intensity can be refined at the same time as the diffraction angle, quantitative analysis can be done without the need for calibration curves. Previous benchtop X-ray diffractometers needed a measurement time of roughly 1-2 hours to measure an X-ray diffraction pattern with the wide angular range and sufficient intensity necessary for quantitative analysis. However, with a benchtop X-ray diffractometer equipped with a high-speed 1-dimensional detector, it is possible to obtain an X-ray diffraction pattern suitable for quantitative analysis in about 10 minutes.