In the past, quantitative analysis with X-ray diffractometry was performed using calibration curves, but due to the progress of computers and analysis software, quantitative analysis using the WPPF (Whole Powder Pattern Fitting) method has now come into wide use. In the WPPF method, profile fitting is performed over a comparatively broad angular range, based on information involving the crystal system and lattice constants. Since diffraction intensity can be refined at the same time as the diffraction angle, quantitative analysis can be done without the need for calibration curves. Previous benchtop X-ray diffractometers needed a measurement time of roughly 1-2 hours to measure an X-ray diffraction pattern with the wide angular range and sufficient intensity necessary for quantitative analysis. However, with a benchtop X-ray diffractometer equipped with a high-speed 1-dimensional detector, it is possible to obtain an X-ray diffraction pattern suitable for quantitative analysis in about 10 minutes.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
Windows®-based software suite for Rigaku's X-ray diffractometers