The calibration curve method is the most common method for quantitative analysis using X-ray diffractometry. However, there are cases where this method cannot be used due to problems involving obtaining the standard samples needed for plotting calibration curves, and the time needed to prepare and measure samples. In these cases, quantification using the RIR (Reference Intensity Ratio) method enables quantitative analysis without the complication of sample preparation and measurement. In the RIR method, quantitative values are easily calculated, using RIR values listed in a database, from integrated intensity of the maximum intensity curves of the examined components. This makes it possible to calculate quantitative values without plotting calibration curves.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Windows®-based software suite for Rigaku's X-ray diffractometers
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers