Using X-ray diffraction, it is possible to identify crystal phases based on the crystalline structure of a material, and evaluate factors such as lattice length, and atom coordinate positions. Therefore, X-ray diffractometry is an analytic technique, which is essential for research on the properties of materials. Within diffractometry, X-ray diffraction measurement under high temperatures is a powerful technique, which goes beyond the identification of material structure and properties that are achieved with ordinary measurement. It enables examination of phase transitions and chemical reactions, which occur under high temperatures, deterioration conditions and synthesis processes, and temperature dependence of lattice constants.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers