If a high-speed 1-dimensional detector is used, and comparison is done under measurement conditions with the same resolution, it is possible to obtain an intensity approximately 100 times that of a scintillation counter (SC). However, if the sample contains elements with a high mass-absorption coefficient for the X-ray wavelength used, then there will be a major increase in the background due to fluorescent X-rays. The D/teX Ultra high-speed 1D X-ray detector has high energy resolution, and can greatly reduce the rise in background due to fluorescent X-rays from the sample by narrowing the detected energy range.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Windows®-based software suite for Rigaku's X-ray diffractometers
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers