In investigations that rely on information gained from evidence left at the scene of a traffic accident, evidence is often limited in the amount available for testing or consists of microscopic traces, which made it difficult to acquire sufficient results with conventional XRD systems. The D/MAX-RAPID II, equipped with a confocal mirror, combines high-brilliance incident X-rays with a large active-area 2D detector, allowing for rapid micro area measurements of several 10 μm in just about 10 minutes.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers