Materials with the same chemical formula but different crystal structures are called crystal polymorphs. Since an X-ray diffraction profile depends on the crystal structure of the measured material, X-ray diffraction measurement is used to evaluate crystal polymorphs. Here we show an example in which a trace component of anatase (TiO₂) contained in titanium oxide with a rutile (TiO₂) structure, sold commercially as a reagent, was evaluated with the standard addition method by using a high-speed 1-dimensional detector.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers