Pole figure measurement is an important technique for determining the crystal orientation of a sample or calculating the volume fraction of the orientation. Especially for the latter, it is crucial that the measured intensities are equal to the true intensities. Some reduction in intensity due to defocus can be compensated for using defocus corrections, but for samples containing coarse grains, the further development of measurement techniques is necessary.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers