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Crystal phase identification of carbide tips by micro-area 2D X-ray diffraction

AppNote B-XRD1044: Crystal phase identification of carbide tips by micro-area 2D X-ray diffraction

Background

Carbide tools used for cutting are provided with various types of coatings to improve durability. Previously, evaluation of the coating layer has been done using X-ray diffraction, but some users want to achieve rapid and simultaneous evaluation of factors such as site-dependent differences in composition, crystallinity and orientation. These evaluations can be easily done by employing the optical element and detector used in this report.

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