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Measurement of trace components using D/teX Ultra

AppNote B-XRD1054: measurement of trace components using D/teX Ultra

Background

The MiniFlex can be equipped with the D/teX Ultra high-speed 1-dimensional detector to obtain greater intensity. By using this detector, it is possible to obtain intensity a few tens to roughly 100 times greater than a scintillation counter. Using this feature, it is possible to greatly reduce measurement time, detect trace components, and measure micro-samples with high sensitivity. Fig. 1 shows the diffraction profiles obtained with a scintillation counter and the D/teX Ultra high-speed 1-dimensional detector. The D/teX Ultra detector measures data faster because it can measure a wide range of 2θ simultaneously with good angular resolution.

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