Background
The MiniFlex can be equipped with the D/teX Ultra high-speed 1-dimensional detector to obtain greater intensity. This detector has a broad detection surface and can efficiently count diffraction X-rays from a sample. As a result, it is possible to obtain intensities from a few tens to roughly 100 times greater than a scintillation counter. Background can also be reduced using the fluorescent X-ray reduction mode, or knife edge etc. By using a knife edge, it is possible to achieve an extreme reduction in scattering on the low-angle side. Also, the knife edge moves in a way which is dependent on the diffraction angle 2θ, and thus there is no blind spot (intensity attenuation) on the high-angle side, and measurement can be done from the low-angle side to the high-angle side.
XRD products from Rigaku
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
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Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers