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Micro-area mapping measurement of printed circuit boards

AppNote XRD1089: Micro-area mapping measurement of printed circuit boards

 

When analyzing a sample consisting of an extremely large number of micro-size parts, such as PCBs (printed circuit boards), it is necessary for the evaluation of the crystalline state of each part to use a focused X-ray beam and irradiate only a specific part. Optical systems in the past employed slits and collimators to convert the divergent beam emitted from the X-ray focal spot to a point focus beam. The downside to this technique is the large attenuation of the X-ray beam intensity, requiring a long time for micro-area measurement to be completed. By using the SmartLab μHR, a SmartLab model with microfocus optics, in combination with a high-speed 2D X-ray detector, a high-intensity micro-area measurement is possible in a short time even though the XG output is 1/10 of those in the past.

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