The peak separation method is often employed in quantitative analysis to analyze amorphous materials by X-ray diffraction techniques. Given the fact that crystalline components and amorphous components both have the same chemical compositions, it is very difficult to apply the peak separation method on samples consisting of multiple components, such as cement. In recent years, the Rietveld method has been used in quantitative analysis of such samples. In this method, the amount of amorphous material can be calculated by adding an internal standard substance to the sample. However, the disadvantages of this method are the complex procedure of adding and mixing the internal standard substance and the long time required for the analysis to be completed. Another quantitative analysis method, the RIR (Reference Intensity Ratio) method, uses the RIR value (intensity ratio of the subject component and corundum (α-Al2O3) when mixed in equal amounts). In contrast to the Rietveld method, if the RIR value of the subject component is known, an internal standard is unnecessary and the quantitative value can be determined by calculation. Here we performed a quantitative analysis of amorphous components in a powder sample consisting of multiple components by Rietveld analysis using the RIR method.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
Windows®-based software suite for Rigaku's X-ray diffractometers