The MiniFlex benchtop X-ray diffractometer can be used with the HyPix-400 MF high-speed two-dimensional detector and the BTS 500 temperature-control attachment (manufactured by Anton Paar), which enables measurements from room temperature to 500°C. With this desktop system, you can observe a phase transition of a substance due to temperature change in real time.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Windows®-based software suite for Rigaku's X-ray diffractometers
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods